Jin; Xiankun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jin; Xiankun.The latest application filed is for "apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof".

Company Profile

12.10.7

Jin; Xiankun - Austin TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatuses Involving Calibration Of Input Offset Voltage And Signal Delay Of Circuits And Methods Thereof App 20210003633 - Chen; Tao ; et al.	2021-01-07
Analog-test-bus apparatuses involving calibration of comparator circuits and methods thereof Grant 10,866,277 - Schat , et al. December 15, 2	2020-12-15
Compensated Alternating Polarity Capacitive Structures App 20200357794 - Jones, III; Robert S. ; et al.	2020-11-12
Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof Grant 10,816,595 - Jin , et al. October 27, 2	2020-10-27
Compensated alternating polarity capacitive structures Grant 10,770,457 - Jones, III , et al. Sep	2020-09-08
Compensated Alternating Polarity Capacitive Structures App 20200144253 - JONES, III; Robert S. ; et al.	2020-05-07
Self-test Apparatuses Involving Distributed Self-test Controller Circuits And Methods Thereof App 20200124662 - Jin; Xiankun ; et al.	2020-04-23
Analog-test-bus Apparatuses Involving Calibration Of Comparator Circuits And Methods Thereof App 20200072900 - Schat; Jan-Peter ; et al.	2020-03-05
Dynamic comparator Grant 10,505,519 - Chen , et al. Dec	2019-12-10
Built-in self test for A/D converter Grant 10,474,553 - Jin , et al. Nov	2019-11-12
Non-intrusive on-chip analog test/trim/calibrate subsystem Grant 10,359,469 - Jin , et al.	2019-07-23
Current source with variable resistor circuit Grant 10,345,841 - Jones, III , et al. July 9, 2	2019-07-09
Non-Intrusive On-Chip Analog Test/Trim/Calibrate Subsystem App 20190178938 - Jin; Xiankun ; et al.	2019-06-13
Built-in Self Test For A/d Converter App 20190026205 - Jin; Xiankun ; et al.	2019-01-24
Method for testing analog-to-digital converter and system therefor Grant 9,473,164 - Chen , et al. October 18, 2	2016-10-18
Method for testing differential analog-to-digital converter and system therefor Grant 9,438,262 - Chen , et al. September 6, 2	2016-09-06
Ramp voltage generator and method for testing an analog-to-digital converter Grant 9,319,033 - Jin , et al. April 19, 2	2016-04-19

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