Patent | Date |
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Plasma doping method with gate shutter Grant 8,652,953 - Okumura , et al. February 18, 2 | 2014-02-18 |
Plasma Doping Method And Apparatus App 20130323916 - OKUMURA; Tomohiro ;   et al. | 2013-12-05 |
Plasma Doping Method With Gate Shutter App 20120285818 - OKUMURA; Tomohiro ;   et al. | 2012-11-15 |
Plasma doping device with gate shutter Grant 8,257,501 - Okumura , et al. September 4, 2 | 2012-09-04 |
Plasma Doping Method And Apparatus App 20120186519 - Okumura; Tomohiro ;   et al. | 2012-07-26 |
Method for introducing impurities and apparatus for introducing impurities Grant 8,222,128 - Sasaki , et al. July 17, 2 | 2012-07-17 |
Impurity introducing apparatus having feedback mechanism using optical characteristics of impurity introducing region Grant 8,138,582 - Jin , et al. March 20, 2 | 2012-03-20 |
Plasma doping method and apparatus Grant 8,129,202 - Okumura , et al. March 6, 2 | 2012-03-06 |
Method For Making Junction And Processed Material Formed Using The Same App 20110237056 - SASAKI; Yuichiro ;   et al. | 2011-09-29 |
Method for making junction and processed material formed using the same Grant 7,981,779 - Sasaki , et al. July 19, 2 | 2011-07-19 |
Process for fabricating semiconductor device Grant 7,932,185 - Kudo , et al. April 26, 2 | 2011-04-26 |
Method and apparatus of fabricating semiconductor device Grant 7,858,479 - Mizuno , et al. December 28, 2 | 2010-12-28 |
Plasma processing method and plasma processing apparatus Grant 7,858,155 - Okumura , et al. December 28, 2 | 2010-12-28 |
Method for forming impurity-introduced layer, method for cleaning object to be processed apparatus for introducing impurity and method for producing device Grant 7,759,254 - Sasaki , et al. July 20, 2 | 2010-07-20 |
Method For Introducing Impurities And Apparatus For Introducing Impurities App 20100167508 - Sasaki; Yuichiro ;   et al. | 2010-07-01 |
Method for introducing impurities and apparatus for introducing impurities Grant 7,741,199 - Sasaki , et al. June 22, 2 | 2010-06-22 |
Impurity Introducing Method Using Optical Characteristics To Determine Annealing Conditions App 20100148323 - Jin; Cheng-Guo ;   et al. | 2010-06-17 |
Method for introducing impurities and apparatus for introducing impurities Grant 7,709,362 - Sasaki , et al. May 4, 2 | 2010-05-04 |
Plasma Doping Method And Apparatus App 20100098837 - OKUMURA; Tomohiro ;   et al. | 2010-04-22 |
Impurity introducing method using optical characteristics to determine annealing conditions Grant 7,700,382 - Jin , et al. April 20, 2 | 2010-04-20 |
Method for introduction impurities and apparatus for introducing impurities Grant 7,696,072 - Sasaki , et al. April 13, 2 | 2010-04-13 |
Plasma Doping Method And Apparatus App 20100009469 - Kai; Takayuki ;   et al. | 2010-01-14 |
Impurity introducing apparatus and impurity introducing method Grant 7,626,184 - Mizuno , et al. December 1, 2 | 2009-12-01 |
Impurity introducing apparatus and impurity introducing method Grant 7,622,725 - Mizuno , et al. November 24, 2 | 2009-11-24 |
Method for introducing impurities and apparatus for introducing impurities Grant 7,618,883 - Sasaki , et al. November 17, 2 | 2009-11-17 |
Method and apparatus for plasma processing Grant 7,601,619 - Okumura , et al. October 13, 2 | 2009-10-13 |
Plasma Doping Method and Apparatus App 20090233383 - Okumura; Tomohiro ;   et al. | 2009-09-17 |
Method of doping impurities, and electronic element using the same Grant 7,582,492 - Jin , et al. September 1, 2 | 2009-09-01 |
Plasma Doping Method and Apparatus App 20090181526 - Okumura; Tomohiro ;   et al. | 2009-07-16 |
Plasma Doping Method and Plasma Processing Device App 20090176355 - Okumura; Tomohiro ;   et al. | 2009-07-09 |
Impurity Introducing Apparatus and Impurity Introducing Method App 20090140174 - Mizuno; Bunji ;   et al. | 2009-06-04 |
Asher, Ashing Method and Impurity Doping Apparatus App 20090104783 - Jin; Cheng-Guo ;   et al. | 2009-04-23 |
Method and Apparatus for Plasma Processing App 20090068769 - Okumura; Tomohiro ;   et al. | 2009-03-12 |
Method for fabricating semiconductor device App 20090023262 - Jin; Cheng-Guo ;   et al. | 2009-01-22 |
Method for introducing impurities Grant 7,456,085 - Sasaki , et al. November 25, 2 | 2008-11-25 |
Plasma Processing Method and Plasma Processing Apparatus App 20080258082 - Okumura; Tomohiro ;   et al. | 2008-10-23 |
Impurity Introducing Apparatus And Impurity Introducing Method App 20080210167 - Mizino; Bunji ;   et al. | 2008-09-04 |
Method of Introducing Impurity App 20080194086 - Sasaki; Yuichiro ;   et al. | 2008-08-14 |
Impurity Introducing Method, Impurity Introducing Apparatus, and Electronic Device Produced by Using Those App 20080182348 - Jin; Cheng-Guo ;   et al. | 2008-07-31 |
Impurity Introducing Apparatus And Impurity Introducing Method App 20080166861 - Mizuno; Bunji ;   et al. | 2008-07-10 |
Method For Introducing Impurities And Apparatus For Introducing Impurities App 20080160728 - SASAKI; Yuichiro ;   et al. | 2008-07-03 |
Method for Introducing Impurities App 20080146009 - Sasaki; Yuichiro ;   et al. | 2008-06-19 |
Method for making junction and processed material formed using the same App 20080135980 - Sasaki; Yuichiro ;   et al. | 2008-06-12 |
Method for introduction impurities and apparatus for introducing impurities App 20080124900 - Sasaki; Yuichiro ;   et al. | 2008-05-29 |
Method of Doping Impurities, and Electronic Element Using the Same App 20080061292 - Jin; Cheng-Guo ;   et al. | 2008-03-13 |
Method for introducing impurities and apparatus for introducing impurities App 20070254460 - Sasaki; Yuichiro ;   et al. | 2007-11-01 |
Method And Apparatus Of Fabricating Semiconductor Device App 20070212837 - Mizuno; Bunji ;   et al. | 2007-09-13 |
Method for making junction and processed material formed using the same App 20070042578 - Sasaki; Yuichiro ;   et al. | 2007-02-22 |
Process for fabricating semiconductor device App 20060183350 - Kudo; Toshio ;   et al. | 2006-08-17 |
Method for introducing impurities and apparatus for introducing impurities App 20050277273 - Sasaki, Yuichiro ;   et al. | 2005-12-15 |