Jiang; Ximan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jiang; Ximan.The latest application filed is for "plasma flood gun for charged particle apparatus".

Company Profile

1.13.14

Jiang; Ximan - San Mateo CA
Jiang; Ximan - Milbrae CA
Jiang; Ximan - El Cerrito CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Plasma Flood Gun For Charged Particle Apparatus App 20220059326 - Jiang; Ximan	2022-02-24
System and method for reducing radiation-induced false counts in an inspection system Grant 10,241,217 - Jiang , et al.	2019-03-26
Plasma source enhanced with booster chamber and low cost plasma strength sensor Grant 9,997,335 - Jiang June 12, 2	2018-06-12
System and Method for Reducing Radiation-Induced False Counts in an Inspection System App 20180045837 - Jiang; Ximan ; et al.	2018-02-15
System and method for reducing radiation-induced false counts in an inspection system Grant 9,841,512 - Jiang , et al. December 12, 2	2017-12-12
Plasma Source Enhanced With Booster Chamber And Low Cost Plasma Strength Sensor App 20170294290 - Jiang; Ximan	2017-10-12
Plasma source enhanced with booster chamber and low cost plasma strength sensor Grant 9,691,592 - Jiang June 27, 2	2017-06-27
Image intensifier tube design for aberration correction and ion damage reduction Grant 9,666,419 - Jiang , et al. May 30, 2	2017-05-30
System and Method for Reducing Radiation-Induced False Counts in an Inspection System App 20160334516 - Jiang; Ximan ; et al.	2016-11-17
Plasma Source Enhanced With Booster Chamber And Low Cost Plasma Strength Sensor App 20160300696 - Jiang; Ximan	2016-10-13
High resolution high quantum efficiency electron bombarded CCD or CMOS imaging sensor Grant 9,460,886 - Jiang , et al. October 4, 2	2016-10-04
High Resolution High Quantum Efficiency Electron Bombarded CCD Or CMOS Imaging Sensor App 20160027605 - Jiang; Ximan ; et al.	2016-01-28
Method and apparatus for detecting buried defects Grant 9,116,109 - Xiao , et al. August 25, 2	2015-08-25
Method And Apparatus For Detecting Buried Defects App 20140319340 - XIAO; Hong ; et al.	2014-10-30
Method and apparatus for detecting buried defects Grant 8,723,115 - Xiao , et al. May 13, 2	2014-05-13
Image Intensifier Tube Design for Aberration Correction and Ion Damage Reduction App 20140063502 - Jiang; Ximan ; et al.	2014-03-06
Method And Apparatus For Detecting Buried Defects App 20130256528 - XIAO; Hong ; et al.	2013-10-03
High brightness--multiple beamlets source for patterned X-ray production Grant 7,609,815 - Leung , et al. October 27, 2	2009-10-27
High Brightness - Multiple Beamlets Source for Patterned X-ray Production App 20080049888 - Leung; Ka-Ngo ; et al.	2008-02-28
Focused electron and ion beam systems Grant 6,768,120 - Leung , et al. July 27, 2	2004-07-27
Focused electron and ion beam systems App 20040036032 - Leung, Ka-Ngo ; et al.	2004-02-26

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