Jiang; Peilin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jiang; Peilin.The latest application filed is for "automatic test pattern generation (atpg) for parametric faults".

Company Profile

1.9.8

Jiang; Peilin - Santa Clara CA
Jiang; Peilin - Linyi Shandong
Jiang; Peilin - Chandler AZ US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Automatic Test Pattern Generation (atpg) For Parametric Faults App 20210264087 - Jiang; Peilin ; et al.	2021-08-26
Overlay metrology system and method Grant 11,067,389 - Chuang , et al. July 20, 2	2021-07-20
Overlay Metrology System and Method App 20190285407 - Chuang; Yung-Ho Alex ; et al.	2019-09-19
Optimized spatial modeling for optical CD metrology Grant 9,915,522 - Jiang , et al. March 13, 2	2018-03-13
Manufacturing Method For Artificial Plant And Artificial Plant App 20160135383 - Jiang; Peilin	2016-05-19
Techniques for optimized scatterometry Grant 9,127,927 - Iloreta , et al. September 8, 2	2015-09-08
Numerical aperture integration for optical critical dimension (OCD) metrology Grant 8,762,100 - Chu , et al. June 24, 2	2014-06-24
Numerical aperture integration for optical critical dimension (OCD) metrology Grant 8,670,948 - Chu , et al. March 11, 2	2014-03-11
Numerical Aperture Integration For Optical Critical Dimension (ocd) Metrology App 20130211760 - CHU; Hanyou ; et al.	2013-08-15
Techniques For Optimized Scatterometry App 20130158948 - Iloreta; Jonathan ; et al.	2013-06-20

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