Jeyaraman; Satheesh

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jeyaraman; Satheesh.The latest application filed is for "method and system for determination of geometric features in objects".

Company Profile

3.3.6

Jeyaraman; Satheesh - Karnataka IN
Jeyaraman; Satheesh - Bangalore IN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for determination of geometric features in objects Grant 10,845,339 - Ganesan , et al. November 24, 2	2020-11-24
Method And System For Determination Of Geometric Features In Objects App 20200041455 - Ganesan; Baskaran ; et al.	2020-02-06
Method and system for determination of geometric features in objects Grant 10,393,705 - Ganesan , et al. A	2019-08-27
System and method for detecting defects in a component Grant 10,152,784 - Nalladega , et al. Dec	2018-12-11
System And Method For Detecting Defects In A Component App 20180005368 - Nalladega; Venkata Vijayaraghava ; et al.	2018-01-04
Method And System For Determination Of Geometric Features In Objects App 20150212048 - Ganesan; Baskaran ; et al.	2015-07-30
Cutting Tool Abnormality Sensing Apparatus App 20120163930 - Jeyaraman; Satheesh ; et al.	2012-06-28
Tool Wear Quantification System And Method App 20110317909 - Jeyaraman; Satheesh ; et al.	2011-12-29
Inspection Systems And Methods For Detection Of Material Property Anomalies App 20090249879 - Jeyaraman; Satheesh ; et al.	2009-10-08

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