Jessen; Scott

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jessen; Scott.The latest application filed is for "mask layer and interconnect structure for dual damascene semiconductor manufacturing".

Company Profile

0.7.8

Jessen; Scott - Orlando FL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mask layer and dual damascene interconnect structure in a semiconductor device Grant 7,067,419 - Huang , et al. June 27, 2	2006-06-27
Substrate topography compensation at mask design: 3D OPC topography anchored Grant 6,893,800 - Jessen , et al. May 17, 2	2005-05-17
Split barrier layer including nitrogen-containing portion and oxygen-containing portion Grant 6,879,046 - Gibson, Jr. , et al. April 12, 2	2005-04-12
Structure and method for isolating porous low-k dielectric films Grant 6,798,043 - Steiner , et al. September 28, 2	2004-09-28
Mask layer and interconnect structure for dual damascene semiconductor manufacturing App 20040171256 - Oladeji, Isaiah O. ; et al.	2004-09-02
Mask layer and dual damascene interconnect structure in a semiconductor device App 20040121579 - Huang, Robert YS ; et al.	2004-06-24
Substrate topography compensation at mask design: 3D OPC topography anchored App 20040058255 - Jessen, Scott ; et al.	2004-03-25
Abnormal photoresist line/space profile detection through signal processing of metrology waveform Grant 6,708,574 - Houge , et al. March 23, 2	2004-03-23
Bond pad support structure for a semiconductor device App 20030218259 - Chesire, Daniel Patrick ; et al.	2003-11-27
Method of focused ion beam pattern transfer using a smart dynamic template Grant 6,627,885 - McIntosh , et al. September 30, 2	2003-09-30
Mask layer and dual damascene interconnect structure in a semiconductor device App 20030119305 - Huang, Robert Y. S. ; et al.	2003-06-26
Mask layer and interconnect structure for dual damascene semiconductor manufacturing App 20030064582 - Oladeji, Isaiah O. ; et al.	2003-04-03
Structure and method for isolating porous low-k dielectric films App 20030001273 - Steiner, Kurt G. ; et al.	2003-01-02
Split barrier layer including nitrogen-containing portion and oxygen-containing portion App 20030003765 - Gibson, Gerald W. JR. ; et al.	2003-01-02
Method analyzing a semiconductor surface using line width metrology with auto-correlation operation Grant 6,258,610 - Blatchford , et al. July 10, 2	2001-07-10

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