Jeong; Seongtae

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jeong; Seongtae.The latest application filed is for "necked interconnect fuse structure for integrated circuits".

Company Profile

1.10.11

Jeong; Seongtae - Portland OR
Jeong; Seongtae - Gyeonggi-do KR
Jeong; Seongtae - Richmond CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Necked interconnect fuse structure for integrated circuits Grant 9,679,845 - Chen , et al. June 13, 2	2017-06-13
Necked Interconnect Fuse Structure For Integrated Circuits App 20170018499 - Chen; Zhanping ; et al.	2017-01-19
Techniques for phase tuning for process optimization Grant 8,959,465 - Nyhus , et al. February 17, 2	2015-02-17
Mask design and OPC for device manufacture Grant 8,778,605 - Ogadhoh , et al. July 15, 2	2014-07-15
Antenna Using Slot In Mobile Terminal App 20140132467 - PARK; Hoon ; et al.	2014-05-15
Techniques For Phase Tuning For Process Optimization App 20140053117 - Nyhus; Paul A. ; et al.	2014-02-20
Mask Design And Opc For Device Manufacture App 20130149638 - OGADHOH; Shem ; et al.	2013-06-13
Mask design and OPC for device manufacture Grant 8,404,403 - Ogadhoh , et al. March 26, 2	2013-03-26
Mask Design And Opc For Device Manufacture App 20110318672 - Ogadhoh; Shem ; et al.	2011-12-29
Measurement of a scattered light point spread function (PSF) for microelectronic photolithography Grant 7,691,544 - Gardiner , et al. April 6, 2	2010-04-06
Measurement of a scattered light point spread function (PSF) for microelectronic photolithography App 20080020292 - Gardiner; Allen B. ; et al.	2008-01-24
Test structures for feature fidelity improvement Grant 7,254,803 - Jeong , et al. August 7, 2	2007-08-07
Test structures for feature fidelity improvement App 20060075366 - Jeong; Seongtae ; et al.	2006-04-06
Combining image imbalance compensation and optical proximity correction in designing phase shift masks App 20060051680 - Tritchkov; Alexander V. ; et al.	2006-03-09
Multi-level scanning method for defect inspection Grant 6,484,306 - Bokor , et al. November 19, 2	2002-11-19

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