Jeong; Changwook

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jeong; Changwook.The latest application filed is for "method of predicting semiconductor material properties and method of testing semiconductor device using the same".

Company Profile

11.5.20

Jeong; Changwook - Hwaseong-si KR
JEONG; Changwook - West Lafayette IN
Jeong; Changwook - Busan KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method Of Predicting Semiconductor Material Properties And Method Of Testing Semiconductor Device Using The Same App 20220207393 - Umezawa; Naoto ; et al.	2022-06-30
System And Method For Training Student Friendly Teacher Model And Student Model App 20220207431 - PARK; Daeyoung ; et al.	2022-06-30
Methods Of Generating Circuit Models And Manufacturing Integrated Circuits Using The Same App 20220121800 - Kim; Yohan ; et al.	2022-04-21
System And Method For Modeling A Semiconductor Fabrication Process App 20220092239 - Kim; Hyunjoong ; et al.	2022-03-24
Simulation Method For Semiconductor Fabrication Process And Method For Manufacturing Semiconductor Device App 20220043405 - Kim; Jinwoo ; et al.	2022-02-10
Proximity Correction Methods For Semiconductor Manufacturing Processes App 20210405521 - Kim; Taehoon ; et al.	2021-12-30
Computing Device, Operating Method Of Computing Device, And Storage Medium App 20210174201 - HUH; In ; et al.	2021-06-10
Non-transitory Computer-readable Medium Storing Program Code Generating Wafer Map Based On Generative Adversarial Networks And Computing Device Including The Same App 20210158173 - JANG; Wonik ; et al.	2021-05-27
Simulation System For Semiconductor Process And Simulation Method Thereof App 20210158152 - MYUNG; Sanghoon ; et al.	2021-05-27
High Optical Transparent Two-dimensional Electronic Conducting System And Process For Generating Same App 20210118588 - ALAM; Muhammad Ashraful ; et al.	2021-04-22
Electronic Devices Generating Verification Vector For Verifying Semiconductor Circuit And Methods Of Operating The Same App 20210117193 - Kim; Seungju ; et al.	2021-04-22
Method And System For Hybrid Model Including Machine Learning Model And Rule-based Model App 20210056425 - JEONG; Changwook ; et al.	2021-02-25
Method And Apparatus With System Verification Based On Reinforcement Learning App 20200364314 - LEE; Jun Haeng ; et al.	2020-11-19
High optical transparent two-dimensional electronic conducting system and process for generating same Grant 10,839,974 - Alam , et al. November 17, 2	2020-11-17
Semiconductor Wafer Fault Analysis System And Operation Method Thereof App 20200175665 - PARK; Min-Chul ; et al.	2020-06-04
Semiconductor fault analysis device and fault analysis method thereof Grant 10,650,910 - Jeong , et al.	2020-05-12
High Optical Transparent Two-dimensional Electronic Conducting System And Process For Generating Same App 20200105434 - ALAM; Muhammad Ashraful ; et al.	2020-04-02
Semiconductor Fault Analysis Device And Fault Analysis Method Thereof App 20190385695 - JEONG; Changwook ; et al.	2019-12-19
High optical transparent two-dimensional electronic conducting system and process for generating same Grant 10,468,151 - Alam , et al. No	2019-11-05
High Optical Transparent Two-dimensional Electronic Conducting System And Process For Generating Same App 20170098486 - ALAM; Muhammad Ashraful ; et al.	2017-04-06
Hybrid transparent conducting materials Grant 9,524,806 - Jeong , et al. December 20, 2	2016-12-20
High Optical Transparent Two-dimensional Electronic Conducting System And Process For Generating Same App 20140014171 - ALAM; Muhammad Ashraful ; et al.	2014-01-16
Hybrid Transparent Conducting Materials App 20130200421 - Jeong; Changwook ; et al.	2013-08-08

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