loadpatents
name:-0.014219999313354
name:-0.0088150501251221
name:-0.00036311149597168
Jeon; Jong Up Patent Filings

Jeon; Jong Up

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jeon; Jong Up.The latest application filed is for "lorentz force microscope and method of measuring magnetic domain using lorentz force".

Company Profile
0.10.11
  • Jeon; Jong Up - Kyungki-do KR
  • Jeon; Jong Up - Suwon-city Kyungki-do KR
  • Jeon; Jong Up - Yongin KR
  • Jeon; Jong Up - Suwon KR
  • Jeon, Jong Up - Yongin-city KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Information storage apparatus using a magnetic medium coated with a wear-resistant thin film
Grant 7,027,364 - Hong , et al. April 11, 2
2006-04-11
Method of fabricating a probe of a scanning probe microscope (SPM) having a field-effect transistor channel
Grant 6,913,982 - Lim , et al. July 5, 2
2005-07-05
Information storage apparatus using semiconductor probe
Grant 6,854,648 - Hong , et al. February 15, 2
2005-02-15
Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof
Grant 6,762,402 - Choi , et al. July 13, 2
2004-07-13
Lorentz force microscope and method of measuring magnetic domain using Lorentz force
Grant 6,696,833 - Hong , et al. February 24, 2
2004-02-24
Apparatus and method for measuring change in capacitance
Grant 6,630,834 - Min , et al. October 7, 2
2003-10-07
Method of fabricating a probe of a scanning probe microscope (SPM) having a field-effect transistor channel
App 20030107058 - Lim, Geunbae ;   et al.
2003-06-12
Information storage apparatus using charge
App 20030107953 - Hong, Seung-Bum ;   et al.
2003-06-12
Lorentz force microscope and method of measuring magnetic domain using Lorentz force
App 20030107372 - Hong, Seung-bum ;   et al.
2003-06-12
Information storage apparatus using semiconductor probe
App 20030098347 - Hong, Seung-bum ;   et al.
2003-05-29
Apparatus for sensing position of electrostatic XY-stage through time-division multiplexing
Grant 6,515,489 - Min , et al. February 4, 2
2003-02-04
Electromagnetic X-Y stage driver for nano data storage system and method for fabricating coils of the same
Grant 6,512,313 - Choi , et al. January 28, 2
2003-01-28
Single stage microactuator for multidimensional actuation with multi-folded spring
Grant 6,509,670 - Jeong , et al. January 21, 2
2003-01-21
Apparatus and method for measuring change in capacitance
App 20030006783 - Min, Dong-ki ;   et al.
2003-01-09
Single stage microactuator for multi-dimensional actuation
Grant 6,445,107 - Jeong , et al. September 3, 2
2002-09-03
Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof
App 20020066855 - Choi, Jae-joon ;   et al.
2002-06-06
Electromagnetic X-Y stage driver for nano data storage system and method for fabricating coils of the same
App 20020047318 - Choi, Jae-joon ;   et al.
2002-04-25
Single stage microactuator for multidimensional actuation with multi-folded spring
App 20020047493 - Jeong, Hee-moon ;   et al.
2002-04-25
Single stage microactuator for multi-dimensional actuation
App 20020038984 - Jeong, Hee-Moon ;   et al.
2002-04-04
Apparatus for sensing position of electrostatic XY-stage through time-division multiplexing
App 20020027191 - Min, Dong-Ki ;   et al.
2002-03-07
Scanning probe microscope (SPM) probe having field effect transistor channel and method of fabricating the same
App 20020008304 - Lim, Gunbae ;   et al.
2002-01-24

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