loadpatents
Patent applications and USPTO patent grants for Jeon; Hyoung Jo.The latest application filed is for "method for measuring semiconductor device".
Patent | Date |
---|---|
Method for measuring semiconductor device Grant 10,551,326 - Kang , et al. Fe | 2020-02-04 |
Method For Measuring Semiconductor Device App 20180202942 - KANG; Hyo Hyeong ;   et al. | 2018-07-19 |
Surface inspecting method Grant 10,001,444 - Ko , et al. June 19, 2 | 2018-06-19 |
Optical Inspection Apparatus And Method And Method Of Fabricating Semiconductor Device Using The Apparatus App 20180144995 - Kim; Young-Duk ;   et al. | 2018-05-24 |
Method for detecting overlay error and method for manufacturing semiconductor device using the same Grant 9,841,688 - Ko , et al. December 12, 2 | 2017-12-12 |
Method For Detecting Overlay Error And Method For Manufacturing Semiconductor Device Using The Same App 20160300767 - Ko; Kang-Woong ;   et al. | 2016-10-13 |
Surface Inspecting Method App 20160153915 - Ko; Kang-woong ;   et al. | 2016-06-02 |
Ellipsometer for detecting surface Grant 9,267,879 - Ko , et al. February 23, 2 | 2016-02-23 |
Ellipsometer For Detecting Surface App 20150077750 - KO; Kang-woong ;   et al. | 2015-03-19 |
Method of inspecting a flat panel display Grant 7,538,750 - Kim , et al. May 26, 2 | 2009-05-26 |
Optical system with image producing surface control unit Grant 7,193,795 - Ahn , et al. March 20, 2 | 2007-03-20 |
Panel inspection apparatus Grant 7,110,104 - Choi , et al. September 19, 2 | 2006-09-19 |
Method of inspecting a flat panel display App 20050151760 - Kim, Jae-wan ;   et al. | 2005-07-14 |
Optical system with image producing surface control unit App 20050094280 - Ahn, Hyeong-Min ;   et al. | 2005-05-05 |
Panel inspection apparatus App 20050018897 - Choi, Ho-seok ;   et al. | 2005-01-27 |
Radioactive image apparatus and focus control method thereof Grant 6,830,376 - Kim , et al. December 14, 2 | 2004-12-14 |
Image processing system and method App 20040114198 - Jeon, Hyoung-Jo ;   et al. | 2004-06-17 |
Radioactive image apparatus and focus control method thereof App 20030223550 - Kim, Jae-Wan ;   et al. | 2003-12-04 |
Method Of Reconstructing A Tomogram Of An X-ray Apparatus App 20030007595 - Kim, Hyeong-Cheol ;   et al. | 2003-01-09 |
Battery Inspection System App 20020166802 - Jung, Jae-Hyun ;   et al. | 2002-11-14 |
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