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name:-0.016390085220337
name:-0.0092949867248535
name:-0.0014710426330566
Jeon; Hyoung Jo Patent Filings

Jeon; Hyoung Jo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jeon; Hyoung Jo.The latest application filed is for "method for measuring semiconductor device".

Company Profile
0.9.13
  • Jeon; Hyoung Jo - Suwon-si KR
  • Jeon; Hyoung-jo - Suwon KR
  • Jeon, Hyoung-jo - Suwon city KR
  • Jeon; Hyoung-Jo - Yongin KR
  • Jeon, Hyoung-Jo - Yongin-City KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for measuring semiconductor device
Grant 10,551,326 - Kang , et al. Fe
2020-02-04
Method For Measuring Semiconductor Device
App 20180202942 - KANG; Hyo Hyeong ;   et al.
2018-07-19
Surface inspecting method
Grant 10,001,444 - Ko , et al. June 19, 2
2018-06-19
Optical Inspection Apparatus And Method And Method Of Fabricating Semiconductor Device Using The Apparatus
App 20180144995 - Kim; Young-Duk ;   et al.
2018-05-24
Method for detecting overlay error and method for manufacturing semiconductor device using the same
Grant 9,841,688 - Ko , et al. December 12, 2
2017-12-12
Method For Detecting Overlay Error And Method For Manufacturing Semiconductor Device Using The Same
App 20160300767 - Ko; Kang-Woong ;   et al.
2016-10-13
Surface Inspecting Method
App 20160153915 - Ko; Kang-woong ;   et al.
2016-06-02
Ellipsometer for detecting surface
Grant 9,267,879 - Ko , et al. February 23, 2
2016-02-23
Ellipsometer For Detecting Surface
App 20150077750 - KO; Kang-woong ;   et al.
2015-03-19
Method of inspecting a flat panel display
Grant 7,538,750 - Kim , et al. May 26, 2
2009-05-26
Optical system with image producing surface control unit
Grant 7,193,795 - Ahn , et al. March 20, 2
2007-03-20
Panel inspection apparatus
Grant 7,110,104 - Choi , et al. September 19, 2
2006-09-19
Method of inspecting a flat panel display
App 20050151760 - Kim, Jae-wan ;   et al.
2005-07-14
Optical system with image producing surface control unit
App 20050094280 - Ahn, Hyeong-Min ;   et al.
2005-05-05
Panel inspection apparatus
App 20050018897 - Choi, Ho-seok ;   et al.
2005-01-27
Radioactive image apparatus and focus control method thereof
Grant 6,830,376 - Kim , et al. December 14, 2
2004-12-14
Image processing system and method
App 20040114198 - Jeon, Hyoung-Jo ;   et al.
2004-06-17
Radioactive image apparatus and focus control method thereof
App 20030223550 - Kim, Jae-Wan ;   et al.
2003-12-04
Method Of Reconstructing A Tomogram Of An X-ray Apparatus
App 20030007595 - Kim, Hyeong-Cheol ;   et al.
2003-01-09
Battery Inspection System
App 20020166802 - Jung, Jae-Hyun ;   et al.
2002-11-14

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