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name:-0.0084221363067627
name:-0.0079011917114258
name:-0.0029840469360352
Jeon; Byeonghwan Patent Filings

Jeon; Byeonghwan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jeon; Byeonghwan.The latest application filed is for "apparatus for and method of performing inspection and metrology process".

Company Profile
2.6.6
  • Jeon; Byeonghwan - Yongin-si KR
  • Jeon; Byeonghwan - Kyungki-do KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Apparatus for and method of performing inspection and metrology process
Grant 10,732,129 - Kim , et al.
2020-08-04
Apparatus For And Method Of Performing Inspection And Metrology Process
App 20190376908 - Kim; Kwang Soo ;   et al.
2019-12-12
Inspection apparatus, semiconductor device manufacturing system including the same, and method of manufacturing a semiconductor device using the same
Grant 10,489,902 - Kim , et al. Nov
2019-11-26
Inspection device for inspecting wafer and method of inspecting wafer using the same
Grant 10,474,133 - Lee , et al. Nov
2019-11-12
Substrate Inspection System
App 20180164227 - KIM; Taejoong ;   et al.
2018-06-14
Inspection Device For Inspecting Wafer And Method Of Inspecting Wafer Using The Same
App 20180150057 - LEE; Janghee ;   et al.
2018-05-31
Optical inspection apparatus, a method of inspecting a substrate, and a method of treating a substrate
Grant 9,915,623 - Kim , et al. March 13, 2
2018-03-13
Inspection Apparatus, Semiconductor Device Manufacturing System Including The Same, And Method Of Manufacturing A Semiconductor Device Using The Same
App 20170116727 - KIM; Kwang Soo ;   et al.
2017-04-27
Optical Inspection Apparatus, A Method Of Inspecting A Substrate, And A Method Of Treating A Substrate
App 20170082552 - Kim; Kwang Soo ;   et al.
2017-03-23
Surface Light Source Using Arrayed Point Light Sources
App 20150308654 - PARK; YOUNGKYU ;   et al.
2015-10-29
Graphics overlay device
Grant 5,883,610 - Jeon March 16, 1
1999-03-16
Apparatus for measuring degree of inclination of objective lens for optical pickup
Grant 5,742,383 - Jeon April 21, 1
1998-04-21

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