Jenoptik Technologie GmbH
Patent Applications and Registrations
Patent applications and USPTO patent grants for Jenoptik Technologie GmbH.The latest application filed is for "method for detection of defects in the inspection of structured surfaces".
- Jenoptik Technologie GmbH - Jena DE
| Patent | Date |
|---|---|
| Method for detection of defects in the inspection of structured surfaces Grant 6,075,880 - Kollhof , et al. June 13, 2 | 2000-06-13 |
| Device for coupling loading and unloading devices with semiconductor processing machines Grant 5,655,869 - Scheler , et al. August 12, 1 | 1997-08-12 |
| Stepped lens with Fresnel surface structure produced by lithography and process for manufacturing of same Grant 5,566,023 - Kley October 15, 1 | 1996-10-15 |
| Device for manipulating a synchrotron beam bundle Grant 5,535,250 - Seher , et al. July 9, 1 | 1996-07-09 |
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