Jenkins; Keith A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jenkins; Keith A..The latest application filed is for "detection of performance degradation in integrated circuits".

Company Profile

16.74.75

Jenkins; Keith A. - Sleepy Hollow NY
Jenkins; Keith A. - New York NY
Jenkins; Keith A - Sleepy Hollow NY
Jenkins; Keith A. - Yorktown Heights NY
Jenkins; Keith A. - Tarrytown NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Degradation monitoring of semiconductor chips Grant 11,131,706 - Jenkins September 28, 2	2021-09-28
Detection of performance degradation in integrated circuits Grant 11,105,856 - Ray , et al. August 31, 2	2021-08-31
Measuring individual device degradation in CMOS circuits Grant 10,901,025 - Linder , et al. January 26, 2	2021-01-26
BTI degradation test circuit Grant 10,782,336 - Jenkins , et al. Sept	2020-09-22
Dynamic predictor of semiconductor lifetime limits Grant 10,746,785 - Cher , et al. A	2020-08-18
Duty cycle measurement Grant 10,739,391 - Jenkins A	2020-08-11
Analytics to determine customer satisfaction Grant 10,671,958 - Balakrishnan , et al.	2020-06-02
Detection Of Performance Degradation In Integrated Circuits App 20200150181 - Ray; Emily A. ; et al.	2020-05-14
Ring oscillator structures to determine local voltage value Grant 10,574,240 - Jenkins , et al. Feb	2020-02-25
Dielectric breakdown monitor Grant 10,564,213 - Huynh , et al. Feb	2020-02-18
Non-destructive analysis to determine use history of processor Grant 10,552,278 - Jenkins , et al. Fe	2020-02-04
Remote monitoring of software Grant 10,491,610 - Jenkins , et al. Nov	2019-11-26
Touch movement activation for gaining access beyond a restricted access gateway Grant 10,433,173 - Jenkins , et al. O	2019-10-01
Analytics To Determine Customer Satisfaction App 20190266538 - Balakrishnan; Karthik ; et al.	2019-08-29
On-chip combined hot carrier injection and bias temperature instability monitor Grant 10,388,580 - Jenkins , et al. A	2019-08-20
Autonomic supply voltage compensation for degradation of circuits over circuit lifetime Grant 10,365,702 - Cher , et al. July 30, 2	2019-07-30
Analytics to determine customer satisfaction Grant 10,360,526 - Balakrishnan , et al.	2019-07-23
Electromigration wearout detection circuits Grant 10,295,589 - Jenkins , et al.	2019-05-21
Measuring individual device degradation in CMOS circuits Grant 10,247,769 - Linder , et al.	2019-04-02
Measuring Individual Device Degradation In Cmos Circuits App 20180364296 - Linder; Barry P. ; et al.	2018-12-20
Non-destructive Analysis To Determine Use History Of Processor App 20180322025 - Jenkins; Keith A. ; et al.	2018-11-08
Non-destructive analysis to determine use history of processor Grant 10,102,090 - Jenkins , et al. October 16, 2	2018-10-16
Autonomic Supply Voltage Compensation for Degradation of Circuits over Circuit Lifetime App 20180292879 - Cher; Chen-Yong ; et al.	2018-10-11
Ultra-broadband switched inductor oscillator Grant 10,075,131 - Han , et al. September 11, 2	2018-09-11
Dielectric Breakdown Monitor App 20180246159 - Huynh; Tam N. ; et al.	2018-08-30
Ring Oscillator Structures To Determine Local Voltage Value App 20180248555 - Jenkins; Keith A. ; et al.	2018-08-30
On-chip Combined Hot Carrier Injection And Bias Temperature Instability Monitor App 20180211894 - Jenkins; Keith A. ; et al.	2018-07-26
On-chip combined hot carrier injection and bias temperature instability monitor Grant 10,002,810 - Jenkins , et al. June 19, 2	2018-06-19
Measurement for transistor output characteristics with and without self heating Grant 9,952,274 - Jenkins , et al. April 24, 2	2018-04-24
Touch movement activation for gaining access beyond a restricted access gateway Grant 9,906,960 - Jenkins , et al. February 27, 2	2018-02-27
Dynamic Predictor Of Semiconductor Lifetime Limits App 20180038906 - Cher; Chen-Yong ; et al.	2018-02-08
Analytics To Determine Customer Satisfaction App 20180032939 - Balakrishnan; Karthik ; et al.	2018-02-01
Touch Movement Activation For Gaining Access Beyond A Restricted Access Gateway App 20180035298 - Jenkins; Keith A. ; et al.	2018-02-01
On-chip leakage measurement Grant 9,863,994 - Cher , et al. January 9, 2	2018-01-09
Test circuit to isolate HCI degradation Grant 9,866,221 - Jenkins , et al. January 9, 2	2018-01-09
Duty Cycle Measurement App 20170350928 - Jenkins; Keith A.	2017-12-07
Remote sensing using pulse-width modulation Grant 9,835,583 - Han , et al. December 5, 2	2017-12-05
Remote sensing using pulse-width modulation Grant 9,835,584 - Han , et al. December 5, 2	2017-12-05
Test Circuit To Isolate Hci Degradation App 20170346492 - Jenkins; Keith A. ; et al.	2017-11-30
Test structure to measure delay variability mismatch of digital logic paths Grant 9,829,535 - Balakrishnan , et al. November 28, 2	2017-11-28
Remote Monitoring Of Software App 20170339167 - Jenkins; Keith A. ; et al.	2017-11-23
Non-destructive Analysis To Determine Use History Of Processor App 20170329685 - Jenkins; Keith A. ; et al.	2017-11-16
Duty cycle measurement Grant 9,817,047 - Jenkins November 14, 2	2017-11-14
Touch Movement Activation For Gaining Access Beyond A Restricted Access Gateway App 20170325093 - Jenkins; Keith A. ; et al.	2017-11-09
Ultra-broadband Switched Inductor Oscillator App 20170310277 - Han; Shu-Jen ; et al.	2017-10-26
Circuit to detect previous use of computer chips using passive test wires Grant 9,791,499 - Jenkins , et al. October 17, 2	2017-10-17
Circuit to detect previous use of computer chips using passive test wires Grant 9,791,500 - Jenkins , et al. October 17, 2	2017-10-17
Carbon nanotube array for cryptographic key generation and protection Grant 9,787,473 - Haensch , et al. October 10, 2	2017-10-10
Bti Degradation Test Circuit App 20170276728 - Jenkins; Keith A. ; et al.	2017-09-28
Electromigration Wearout Detection Circuits App 20170269152 - Jenkins; Keith A. ; et al.	2017-09-21
On-chip Leakage Measurement App 20170254846 - Cher; Chen-Yong ; et al.	2017-09-07
Simultaneously measuring degradation in multiple FETs Grant 9,702,924 - Balakrishnan , et al. July 11, 2	2017-07-11
Carbon based CMOS sensor ring oscillator Grant 9,692,397 - Han , et al. June 27, 2	2017-06-27
Measurement for transistor output characteristics with and without self heating Grant 9,678,141 - Jenkins , et al. June 13, 2	2017-06-13
Degradation Monitoring Of Semiconductor Chips App 20170160339 - Jenkins; Keith A.	2017-06-08
Carbon nanotube array for cryptographic key generation and protection Grant 9,660,806 - Haensch , et al. May 23, 2	2017-05-23
Duty Cycle Measurement App 20170102420 - Jenkins; Keith A.	2017-04-13
Carbon Nanotube Array for Cryptographic Key Generation and Protection App 20170063543 - Haensch; Wilfried ; et al.	2017-03-02
Measuring Individual Device Degradation In Cmos Circuits App 20170059644 - Linder; Barry P. ; et al.	2017-03-02
On-chip Combined Hot Carrier Injection And Bias Temperature Instability Monitor App 20160377672 - Jenkins; Keith A. ; et al.	2016-12-29
Carbon Based Cmos Sensor Ring Oscillator App 20160377566 - Han; Shu-Jen ; et al.	2016-12-29
Circuit To Detect Previous Use Of Computer Chips Using Passive Test Wires App 20160341788 - Jenkins; Keith A. ; et al.	2016-11-24
Simultaneously Measuring Degradation In Multiple Fets App 20160341785 - Balakrishnan; Karthik ; et al.	2016-11-24
Remote Sensing Using Pulse-width Modulation App 20160313275 - Han; Shu-Jen ; et al.	2016-10-27
Remote Sensing Using Pulse-width Modulation App 20160313276 - Han; Shu-Jen ; et al.	2016-10-27
Measurement For Transistor Output Characteristics With And Without Self Heating App 20160266196 - Jenkins; Keith A. ; et al.	2016-09-15
Measurement For Transistor Output Characteristics With And Without Self Heating App 20160266195 - Jenkins; Keith A. ; et al.	2016-09-15
Test Structure To Measure Delay Variability Mismatch Of Digital Logic Paths App 20160209467 - Balakrishnan; Karthik ; et al.	2016-07-21
Carbon Nanotube Array for Cryptographic Key Generation and Protection App 20160191255 - Haensch; Wilfried ; et al.	2016-06-30
High frequency oscillator circuit Grant 9,276,524 - Jenkins , et al. March 1, 2	2016-03-01
Circuit To Detect Previous Use Of Computer Chips Using Passive Test Wires App 20150338454 - Jenkins; Keith A. ; et al.	2015-11-26
High Frequency Oscillator Circuit App 20150303871 - Jenkins; Keith A. ; et al.	2015-10-22
Reducing performance degradation in backup semiconductor chips Grant 9,110,777 - Bansal , et al. August 18, 2	2015-08-18
High density memory device Grant 8,987,693 - Barwicz , et al. March 24, 2	2015-03-24
On-chip measurement of AC variability in individual transistor devices Grant 8,890,542 - Balakrishnan , et al. November 18, 2	2014-11-18
On-chip measurement of AC variability in individual transistor devices Grant 8,829,922 - Balakrishnan , et al. September 9, 2	2014-09-09
High frequency oscillator circuit and method to operate same Grant 8,816,787 - Jenkins , et al. August 26, 2	2014-08-26
Circuit and method for RAS-enabled and self-regulated frequency and delay sensor Grant 8,729,920 - Graas , et al. May 20, 2	2014-05-20
High Frequency Oscillator Circuit And Method To Operate Same App 20140022025 - Jenkins; Keith A. ; et al.	2014-01-23
Reducing Performance Degradation In Backup Semiconductor Chips App 20130212414 - Bansal; Aditya ; et al.	2013-08-15
On-Chip Delay Measurement Through a Transistor Array App 20130049791 - Jenkins; Keith A. ; et al.	2013-02-28
High density memory device Grant 8,362,477 - Barwicz , et al. January 29, 2	2013-01-29
On-chip Signal Waveform Measurement Circuit App 20130015837 - Jenkins; Keith A. ; et al.	2013-01-17
On-chip Measurement Of Ac Variability In Individual Transistor Devices App 20120326728 - Balakrishnan; Karthik ; et al.	2012-12-27
High Density Memory Device App 20120300534 - Barwicz; Tymon ; et al.	2012-11-29
On-chip Measurement Of Ac Variability In Individual Transistor Devices App 20120212238 - Balakrishnan; Karthik ; et al.	2012-08-23
Circuit And Method For Ras-enabled And Self-regulated Frequency And Delay Sensor App 20120126870 - GRAAS; Carole D. ; et al.	2012-05-24
On-Chip Delay Measurement Through a Transistor Array App 20120081141 - Jenkins; Keith A. ; et al.	2012-04-05
Self-aligned graphene transistor Grant 8,106,383 - Jenkins , et al. January 31, 2	2012-01-31
High Density Memory Device App 20110235390 - Barwicz; Tymon ; et al.	2011-09-29
Electronic circuit for measurement of transistor variability and the like Grant 8,004,305 - Jenkins , et al. August 23, 2	2011-08-23
Self-aligned Graphene Transistor App 20110114919 - Jenkins; Keith A. ; et al.	2011-05-19
Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits Grant 7,863,918 - Jenkins , et al. January 4, 2	2011-01-04
On-chip jitter measurement circuit Grant 7,791,330 - Heidel , et al. September 7, 2	2010-09-07
On chip temperature measuring and monitoring circuit and method Grant 7,780,347 - Franch , et al. August 24, 2	2010-08-24
On-chip characterization of noise-margins for memory arrays Grant 7,768,848 - Jenkins , et al. August 3, 2	2010-08-03
On chip temperature measuring and monitoring method Grant 7,762,721 - Franch , et al. July 27, 2	2010-07-27
Methods of operating an electronic circuit for measurement of transistor variability and the like Grant 7,764,080 - Jenkins , et al. July 27, 2	2010-07-27
On chip temperature measuring and monitoring method Grant 7,645,071 - Franch , et al. January 12, 2	2010-01-12
Electronic Circuit For Measurement Of Transistor Variability And The Like App 20090309625 - Jenkins; Keith A. ; et al.	2009-12-17
Electrical component tuned by conductive layer deletion Grant 7,538,652 - Jenkins , et al. May 26, 2	2009-05-26
Disposable Built-in Self-test Devices, Systems And Methods For Testing Three Dimensional Integrated Circuits App 20090121736 - JENKINS; KEITH A. ; et al.	2009-05-14
On-chip Characterization Of Noise-margins For Memory Arrays App 20090116325 - JENKINS; KEITH A. ; et al.	2009-05-07
Monitoring Degradation Of Circiut Speed App 20090063061 - BOLAM; RONALD J. ; et al.	2009-03-05
Methods of Operating an Electronic Circuit for Measurement of Transistor Variability and the Like App 20080315907 - Jenkins; Keith A. ; et al.	2008-12-25
On Chip Temperature Measuring And Monitoring Circuit And Method App 20080291970 - Franch; Robert L. ; et al.	2008-11-27
On-chip Jitter Measurement Circuit App 20080284477 - Heidel; David F. ; et al.	2008-11-20
On chip temperature measuring and monitoring circuit and method Grant 7,452,128 - Franch , et al. November 18, 2	2008-11-18
On-chip power supply noise detector Grant 7,443,187 - Jenkins , et al. October 28, 2	2008-10-28
On-Chip Power Supply Noise Detector App 20080258751 - Jenkins; Keith A. ; et al.	2008-10-23
On-chip jitter measurement circuit Grant 7,439,724 - Heidel , et al. October 21, 2	2008-10-21
Electronic circuit for measurement of transistor variability and the like Grant 7,439,755 - Jenkins , et al. October 21, 2	2008-10-21
On-chip Power Supply Monitor Using Latch Delay Sensor App 20080203998 - Jenkins; Keith A.	2008-08-28
System And Method For Determining A Delay Time Interval Of Components App 20080195341 - Jenkins; Keith A. ; et al.	2008-08-14
On Chip Temperature Measuring And Monitoring Method App 20080186035 - Franch; Robert L. ; et al.	2008-08-07
On Chip Temperature Measuring And Monitoring Method App 20080187024 - Franch; Robert L. ; et al.	2008-08-07
Electronic Circuit for Measurement of Transistor Variability and the Like App 20080180134 - Jenkins; Keith A. ; et al.	2008-07-31
System and method for determining a delay time interval of components Grant 7,378,831 - Jenkins , et al. May 27, 2	2008-05-27
On-chip power supply noise detector Grant 7,355,429 - Jenkins , et al. April 8, 2	2008-04-08
Electrical component tuned by conductive layer deletion App 20080055036 - Jenkins; Keith A. ; et al.	2008-03-06
On-chip Power Supply Noise Detector App 20080036477 - Jenkins; Keith A. ; et al.	2008-02-14
On Chip Temperature Measuring And Monitoring Circuit And Method App 20080025371 - Franch; Robert L. ; et al.	2008-01-31
On Chip Temperature Measuring And Monitoring Circuit And Method App 20070206656 - Franch; Robert L. ; et al.	2007-09-06
On chip temperature measuring and monitoring circuit and method Grant 7,255,476 - Franch , et al. August 14, 2	2007-08-14
Integrated CMOS spectrum analyzer for on-chip diagnostics using digital autocorrelation of coarsely quantized signals Grant 7,218,091 - Jenkins , et al. May 15, 2	2007-05-15
System and method using locally heated island for integrated circuit testing Grant 7,170,310 - Jenkins , et al. January 30, 2	2007-01-30
On-chip power supply noise detector App 20060214672 - Jenkins; Keith A. ; et al.	2006-09-28
Programmable jitter signal generator Grant 7,095,264 - Jenkins , et al. August 22, 2	2006-08-22
Apparatus and method for thermal isolation, circuit cooling and electromagnetic shielding of a wafer Grant 7,033,927 - Cohen , et al. April 25, 2	2006-04-25
System and method using locally heated island for integrated circuit testing App 20060049843 - Jenkins; Keith A. ; et al.	2006-03-09
Apparatus and method for thermal isolation, circuit cooling and electromagnetic shielding of a wafer App 20050282381 - Cohen, Guy M. ; et al.	2005-12-22
On chip temperature measuring and monitoring circuit and method App 20050232333 - Franch, Robert L. ; et al.	2005-10-20
Programmable jitter signal generator App 20050116759 - Jenkins, Keith A. ; et al.	2005-06-02
On-chip jitter measurement circuit App 20050036578 - Heidel, David F. ; et al.	2005-02-17
Method and apparatus for determining phase locked loop jitter Grant 6,441,602 - Eckhardt , et al. August 27, 2	2002-08-27
On-chip ground plane for semiconductor devices to reduce parasitic signal propagation Grant 5,485,029 - Crabbe , et al. January 16, 1	1996-01-16