Jee; Yun-jung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jee; Yun-jung.The latest application filed is for "method of inspecting surface and method of manufacturing semiconductor device".

Company Profile

4.12.18

Jee; Yun-jung - Seongnam-si KR
Jee; Yun-Jung - Yongin-si KR
Jee; Yun-Jung - Gyeonggi-do KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of inspecting surface and method of manufacturing semiconductor device Grant 11,043,433 - Ryu , et al. June 22, 2	2021-06-22
Method Of Inspecting Surface And Method Of Manufacturing Semiconductor Device App 20200203232 - RYU; Sung-yoon ; et al.	2020-06-25
Defect inspection method and defect inspection apparatus Grant 10,593,032 - Ryu , et al.	2020-03-17
Scanning probe inspector Grant 10,585,115 - Oh , et al.	2020-03-10
Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same Grant 10,527,556 - Rim , et al. J	2020-01-07
Method Of Inspecting Surface And Method Of Manufacturing Semiconductor Device App 20190214316 - RYU; Sung-yoon ; et al.	2019-07-11
Scanning Probe Inspector App 20190170788 - Oh; Duck Mahn ; et al.	2019-06-06
Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same Grant 10,281,410 - Rim , et al.	2019-05-07
Method of inspecting surface and method of manufacturing semiconductor device Grant 10,249,544 - Ryu , et al.	2019-04-02
Systems And Methods Of Testing Semiconductor Devices Using Simultaneously Scanning Of A Plurality Of Regions Therein And Methods Of Forming Semiconductor Devices Using The Same App 20180356349 - Rim; Min Ho ; et al.	2018-12-13
Optical Measuring Method And Apparatus, And Method Of Manufacturing Semiconductor Device Using The Same App 20180340894 - RIM; Min-Ho ; et al.	2018-11-29
Semiconductor Device Inspection Apparatus And Method Of Driving The Same App 20180106731 - RIM; MIN HO ; et al.	2018-04-19
Method Of Inspecting Surface And Method Of Manufacturing Semiconductor Device App 20180061718 - RYU; Sung-yoon ; et al.	2018-03-01
Defect Inspection Method And Defect Inspection Apparatus App 20180053295 - Ryu; Sung-Yoon ; et al.	2018-02-22
Wafer Inspection Apparatus Using Three-Dimensional Image App 20160261786 - Ahn; Jeong-ho ; et al.	2016-09-08
Method Of Inspecting A Substrate App 20100156446 - KIM; Chun-Yong ; et al.	2010-06-24
Wafer holder and wafer conveyor equipped with the same Grant 7,666,069 - Kim , et al. February 23, 2	2010-02-23
Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same Grant 7,428,328 - Jee , et al. September 23, 2	2008-09-23
Method and apparatus for inspecting a wafer surface Grant 7,310,140 - Eom , et al. December 18, 2	2007-12-18
Method of measuring critical dimension App 20070202615 - Lee; Byung-Sug ; et al.	2007-08-30
Wafer holder and wafer conveyor equipped with the same App 20070190904 - Kim; Tae-Kyoung ; et al.	2007-08-16
Method of inspecgin a leakage current characteristic of a dielectric layer App 20070188185 - Eom; Tae-Min ; et al.	2007-08-16
Wafer holder and wafer conveyor system equipped with the same Grant 7,220,173 - Kim , et al. May 22, 2	2007-05-22
Method of inspecting a leakage current characteristic of a dielectric layer and apparatus for performing the method Grant 7,186,280 - Eom , et al. March 6, 2	2007-03-06
Method for monitoring a density profile of impurities Grant 7,186,577 - Jee , et al. March 6, 2	2007-03-06
Method of inspecting a leakage current characteristic of a dielectric layer and apparatus for performing the method App 20060022698 - Eom; Tae-Min ; et al.	2006-02-02
Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same App 20060011837 - Jee; Yun-Jung ; et al.	2006-01-19
Wafer holder and wafer conveyor system equipped with the same App 20050221740 - Kim, Tae-Kyoung ; et al.	2005-10-06
Method and apparatus for inspecting a wafer surface App 20040263836 - Eom, Tae-Min ; et al.	2004-12-30
Method and apparatus for monitoring a density profile of impurities App 20040253750 - Jee, Yun-Jung ; et al.	2004-12-16

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