Jayaraman; Thirupurasundari

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jayaraman; Thirupurasundari.The latest application filed is for "methods for improving optical inspection and metrology image quality using chip design data".

Company Profile

5.6.7

Jayaraman; Thirupurasundari - Chennai IN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods For Improving Optical Inspection And Metrology Image Quality Using Chip Design Data App 20220270212 - Sah; Kaushik ; et al.	2022-08-25
Creating defect samples for array regions Grant 10,620,134 - Anantha , et al.	2020-04-14
Creating Defect Samples for Array Regions App 20190346375 - Anantha; Vidyasagar ; et al.	2019-11-14
Methods to store dynamic layer content inside a design file Grant 10,387,601 - Jayaraman , et al. A	2019-08-20
System and method for defect classification based on electrical design intent Grant 10,209,628 - Uppaluri , et al. Feb	2019-02-19
Automatic deskew using design files or inspection images Grant 10,204,416 - Jain , et al. Feb	2019-02-12
Sub-pixel alignment of inspection to design Grant 9,996,942 - Bhattacharyya , et al. June 12, 2	2018-06-12
Dynamic design attributes for wafer inspection Grant 9,865,512 - Jayaraman , et al. January 9, 2	2018-01-09
System and Method for Defect Classification Based on Electrical Design Intent App 20170344695 - Uppaluri; Prasanti ; et al.	2017-11-30
Automatic Deskew Using Design Files Or Inspection Images App 20170228866 - Jain; Arpit ; et al.	2017-08-10
Methods to Store Dynamic Layer Content Inside a Design File App 20170154147 - Jayaraman; Thirupurasundari ; et al.	2017-06-01
Sub-Pixel Alignment of Inspection to Design App 20160275672 - Bhattacharyya; Santosh ; et al.	2016-09-22
Dynamic Design Attributes For Wafer Inspection App 20140303921 - Jayaraman; Thirupurasundari ; et al.	2014-10-09

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