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Patent applications and USPTO patent grants for Jayaraman; Thirupurasundari.The latest application filed is for "methods for improving optical inspection and metrology image quality using chip design data".
Patent | Date |
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Methods For Improving Optical Inspection And Metrology Image Quality Using Chip Design Data App 20220270212 - Sah; Kaushik ;   et al. | 2022-08-25 |
Creating defect samples for array regions Grant 10,620,134 - Anantha , et al. | 2020-04-14 |
Creating Defect Samples for Array Regions App 20190346375 - Anantha; Vidyasagar ;   et al. | 2019-11-14 |
Methods to store dynamic layer content inside a design file Grant 10,387,601 - Jayaraman , et al. A | 2019-08-20 |
System and method for defect classification based on electrical design intent Grant 10,209,628 - Uppaluri , et al. Feb | 2019-02-19 |
Automatic deskew using design files or inspection images Grant 10,204,416 - Jain , et al. Feb | 2019-02-12 |
Sub-pixel alignment of inspection to design Grant 9,996,942 - Bhattacharyya , et al. June 12, 2 | 2018-06-12 |
Dynamic design attributes for wafer inspection Grant 9,865,512 - Jayaraman , et al. January 9, 2 | 2018-01-09 |
System and Method for Defect Classification Based on Electrical Design Intent App 20170344695 - Uppaluri; Prasanti ;   et al. | 2017-11-30 |
Automatic Deskew Using Design Files Or Inspection Images App 20170228866 - Jain; Arpit ;   et al. | 2017-08-10 |
Methods to Store Dynamic Layer Content Inside a Design File App 20170154147 - Jayaraman; Thirupurasundari ;   et al. | 2017-06-01 |
Sub-Pixel Alignment of Inspection to Design App 20160275672 - Bhattacharyya; Santosh ;   et al. | 2016-09-22 |
Dynamic Design Attributes For Wafer Inspection App 20140303921 - Jayaraman; Thirupurasundari ;   et al. | 2014-10-09 |
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