Jau; Jack Y.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jau; Jack Y..The latest application filed is for "structure and method for determining a defect in integrated circuit manufacturing process".

Company Profile

0.10.6

Jau; Jack Y. - Los Altos Hills CA US
Jau; Jack Y. - Los Altos CA
Jau; Jack Y. - Fremont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Structure and method for determining a defect in integrated circuit manufacturing process Grant 9,035,674 - Xiao , et al. May 19, 2	2015-05-19
Method and system for detecting or reviewing open contacts on a semiconductor device Grant 8,748,815 - Zhao , et al. June 10, 2	2014-06-10
Structure And Method For Determining A Defect In Integrated Circuit Manufacturing Process App 20120083055 - XIAO; Hong ; et al.	2012-04-05
In-line overlay measurement using charged particle beam system Grant 8,010,307 - Fang , et al. August 30, 2	2011-08-30
Method And System For The Visual Classification Of Defects App 20090080763 - JAU; JACK Y. ; et al.	2009-03-26
Structure And Method For Determining A Defect In Integrated Circuit Manufacturing Process App 20080265251 - XIAO; Hong ; et al.	2008-10-30
In-line Overlay Measurement Using Charged Particle Beam System App 20080215276 - Fang; Wei ; et al.	2008-09-04
Method And System For Creating Knowledge And Selecting Features In A Semiconductor Device App 20080175468 - Jau; Jack Y. ; et al.	2008-07-24
Method and system for detecting or reviewing open contacts on a semiconductor device App 20080054931 - Zhao; Frederick Y. ; et al.	2008-03-06
Method and apparatus for scanning semiconductor wafers using a scanning electron microscope Grant 6,881,956 - Jau , et al. April 19, 2	2005-04-19
Method and apparatus for scanning semiconductor wafers using a scanning electron microscope Grant 6,710,342 - Jau , et al. March 23, 2	2004-03-23
Inspecting optical masks with electron beam microscopy Grant 5,717,204 - Meisburger , et al. February 10, 1	1998-02-10
Inspecting optical masks with electron beam microscopy Grant 5,665,968 - Meisburger , et al. September 9, 1	1997-09-09
Electron beam inspection system and method Grant 5,502,306 - Meisburger , et al. March 26, 1	1996-03-26

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