Jastrzebski; Lubomir L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jastrzebski; Lubomir L..The latest application filed is for "micro photoluminescence imaging".

Company Profile

2.27.7

Jastrzebski; Lubomir L. - Clearwater FL
Jastrzebski; Lubomir L. - Plainsboro NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Micro photoluminescence imaging Grant 10,883,941 - Kiss , et al. January 5, 2	2021-01-05
Micro Photoluminescence Imaging App 20200300767 - Kiss; Zoltan Tamas ; et al.	2020-09-24
Micro Photoluminescence Imaging App 20190391079 - Kiss; Zoltan Tamas ; et al.	2019-12-26
Micro photoluminescence imaging with optical filtering Grant 10,209,190 - Kiss , et al. Feb	2019-02-19
Micro Photoluminescence Imaging With Optical Filtering App 20180313761 - Kiss; Zoltan Tamas ; et al.	2018-11-01
Micro photoluminescence imaging with optical filtering Grant 10,018,565 - Kiss , et al. July 10, 2	2018-07-10
Micro photoluminescence imaging Grant 10,012,593 - Kiss , et al. July 3, 2	2018-07-03
Micro Photoluminescence Imaging App 20160328840 - Kiss; Zoltan Tamas ; et al.	2016-11-10
Micro Photoluminescence Imaging With Optical Filtering App 20160327485 - Kiss; Zoltan Tamas ; et al.	2016-11-10
Enhanced Sensitivity Non-contact Electrical Monitoring Of Copper Contamination On Silicon Surface App 20090047748 - Savtchouk; Alexandre ; et al.	2009-02-19
Determining composition of mixed dielectrics Grant 6,815,974 - Lagowski , et al. November 9, 2	2004-11-09
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current Grant 6,680,621 - Savtchouk , et al. January 20, 2	2004-01-20
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current App 20020125900 - Savtchouk, Alexander ; et al.	2002-09-12
Method for forming dielectrically isolated transistor Grant 4,923,826 - Jastrzebski , et al. May 8, 1	1990-05-08
Method for making a silicon-on-insulator substrate Grant 4,891,092 - Jastrzebski January 2, 1	1990-01-02
High temperature annealing to improve SIMOX characteristics Grant 4,824,698 - Jastrzebski , et al. April 25, 1	1989-04-25
Method of making integrated circuit with pair of MOS field effect transistors sharing a common source/drain region Grant 4,772,568 - Jastrzebski September 20, 1	1988-09-20
Optical reflectance method of examining a SIMOX article Grant 4,766,317 - Harbeke , et al. August 23, 1	1988-08-23
Dielectrically isolated PMOS, NMOS, PNP and NPN transistors on a silicon wafer Grant 4,751,561 - Jastrzebski June 14, 1	1988-06-14
Recessed oxide method for making a silicon-on-insulator substrate Grant 4,704,186 - Jastrzebski November 3, 1	1987-11-03
Method of depositing uniformly thick selective epitaxial silicon Grant 4,698,316 - Corboy, Jr. , et al. October 6, 1	1987-10-06
Fabricating of a CMOS FET with reduced latchup susceptibility Grant 4,619,033 - Jastrzebski October 28, 1	1986-10-28
Method for forming uniformly thick selective epitaxial silicon Grant 4,592,792 - Corboy, Jr. , et al. June 3, 1	1986-06-03
Vertical IGFET with internal gate and method for making same Grant 4,586,240 - Blackstone , et al. May 6, 1	1986-05-06
Method for growing monocrystalline silicon through mask layer Grant 4,578,142 - Corboy, Jr. , et al. March 25, 1	1986-03-25
CMOS Structure incorporating vertical IGFETS Grant 4,566,025 - Jastrzebski , et al. January 21, 1	1986-01-21
Method for forming a void-free monocrystalline epitaxial layer on a mask Grant 4,557,794 - McGinn , et al. December 10, 1	1985-12-10
Vertically integrated IGFET device Grant 4,554,570 - Jastrzebski , et al. November 19, 1	1985-11-19
Method for growing monocrystalline silicon on a mask layer Grant 4,549,926 - Corboy, Jr. , et al. October 29, 1	1985-10-29
Vertical IGFET with internal gate and method for making same Grant 4,546,375 - Blackstone , et al. October 8, 1	1985-10-08
Method for fabricating a self-aligned vertical IGFET Grant 4,530,149 - Jastrzebski , et al. July 23, 1	1985-07-23
Method to determine the crystalline properties of an interface of two materials by an optical technique Grant 4,498,772 - Jastrzebski , et al. February 12, 1	1985-02-12
CCD Imagers with substrates having drift field Grant 4,481,522 - Jastrzebski , et al. November 6, 1	1984-11-06
Semiconductor imagers Grant 4,348,690 - Jastrzebski , et al. September 7, 1	1982-09-07

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