JAPAN ELECTRONIC MATERIALS CORP.
Patent Applications and Registrations
Patent applications and USPTO patent grants for JAPAN ELECTRONIC MATERIALS CORP..The latest application filed is for "contact probe".
Company Profile
6.36.20
- JAPAN ELECTRONIC MATERIALS CORP. - Hyogo JP
- JAPAN ELECTRONIC MATERIALS CORPORATION - Amagasaki-shi, Hyogo N/A JP
- JAPAN ELECTRONIC MATERIALS CORPORATION - Amagasaki-Shi JP
- Japan Electronic Materials Corporation - Hyogo N/A JP
- Japan Electronic Materials Corporation - Amagasski-shi JP
- JAPAN ELECTRONIC MATERIALS CORP. - Amagasaki JP
- Japan Electronic Materials Corp.; - Amagasaki-city JP
- Japan Electronic Materials Corp. -
- Japan Electronic Materials Corporation - Amagasaki JP
- Japan Electronic Materials Corp. - 2-5-13, Nishinagasu-cho Amagasaki-shi JP
- Japan Electronic Materials Corporation - Hyogo-Ken JP
- Japan Electronic Materials Corp. - both of JP
- Japan Electronic Materials Corporation - JP JP
- Japan Electronic Materials Corp. - Amagasakishi JP
Patent Activity
| Patent | Date |
|---|---|
| Probe card case and probe card transfer method Grant 10,908,180 - Mori , et al. February 2, 2 | 2021-02-02 |
| Probe guide plate and probe device Grant 10,386,387 - Fujihara , et al. A | 2019-08-20 |
| Probe guide plate and probe device Grant 10,309,988 - Shimizu , et al. | 2019-06-04 |
| Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plate Grant 10,261,110 - Shimizu , et al. | 2019-04-16 |
| Probe card case and probe card transfer method Grant 10,184,954 - Mori , et al. Ja | 2019-01-22 |
| Probe guide, probe card, and method for probe guide manufacturing Grant 10,139,430 - Mori , et al. Nov | 2018-11-27 |
| Contact probe Grant 9,972,933 - Kimura , et al. May 15, 2 | 2018-05-15 |
| Guide plate for a probe card and probe card provided with same Grant 9,841,438 - Kimura , et al. December 12, 2 | 2017-12-12 |
| Contact Probe App 20170346211 - Kimura; Teppei ; et al. | 2017-11-30 |
| Contact probe Grant 9,774,121 - Kimura , et al. September 26, 2 | 2017-09-26 |
| Probe Guide, Probe Card, And Method For Probe Guide Manufacturing App 20170242057 - Mori; Chikaomi ; et al. | 2017-08-24 |
| Probe Guide Plate And Probe Device App 20170205445 - Shimizu; Yuichiro ; et al. | 2017-07-20 |
| Probe Guide Plate And Probe Device App 20170205444 - Fujihara; Kosuke ; et al. | 2017-07-20 |
| Probe Card Case And Probe Card Transfer Method App 20170153272 - Mori; Chikaomi ; et al. | 2017-06-01 |
| Probe Guide Plate And Probe Apparatus App 20170146569 - Shimizu; Yuichiro ; et al. | 2017-05-25 |
| Guide Plate For A Probe Card And Probe Card Provided With Same App 20170082657 - KIMURA; Teppei ; et al. | 2017-03-23 |
| Guide plate for a probe card and probe card provided with same Grant 9,535,096 - Kimura , et al. January 3, 2 | 2017-01-03 |
| Probe guide plate and method for manufacturing the same Grant 9,523,716 - Shiraishi , et al. December 20, 2 | 2016-12-20 |
| Guide plate for probe card Grant 9,459,287 - Kimura , et al. October 4, 2 | 2016-10-04 |
| Probe card case Grant D751,555 - Mori , et al. March 15, 2 | 2016-03-15 |
| Guide Plate For A Probe Card And Probe Card Provided With Same App 20150301083 - KIMURA; Teppei ; et al. | 2015-10-22 |
| Probe Card Case And Probe Card Transfer Method App 20150285838 - Mori; Chikaomi ; et al. | 2015-10-08 |
| Electrical Contact App 20150280345 - Kimura; Teppei ; et al. | 2015-10-01 |
| Guide Plate For Probe Card App 20140266275 - KIMURA; Teppei ; et al. | 2014-09-18 |
| Probe Card And Manufacturing Method Therefor App 20130265073 - Nakano; Hirofumi ; et al. | 2013-10-10 |
| Semiconductor test system and relay driving test method therefor Grant 8,456,171 - Matsuno , et al. June 4, 2 | 2013-06-04 |
| Multilayer Insulating Substrate And Method For Manufacturing The Same App 20130105212 - Tsuboi; Mitsuaki | 2013-05-02 |
| Optical device inspecting apparatus Grant 8,159,659 - Osawa , et al. April 17, 2 | 2012-04-17 |
| Probe App 20110291685 - Mori; Chikaomi | 2011-12-01 |
| Semiconductor Test System And Relay Driving Test Method Therefor App 20110193562 - Matsuno; Shingo ; et al. | 2011-08-11 |
| Bimetallic probe with tip end Grant 7,692,438 - Machida , et al. April 6, 2 | 2010-04-06 |
| Probe Card and Manufacturing Method Thereof App 20090174422 - Machida; Kazumichi | 2009-07-09 |
| Probe card and contactor of the same Grant 7,106,080 - Mori , et al. September 12, 2 | 2006-09-12 |
| Probe card for examining semiconductor devices on semiconductor wafers Grant 7,081,766 - Satou , et al. July 25, 2 | 2006-07-25 |
| Probe card and contactor of the same Grant 6,967,493 - Mori , et al. November 22, 2 | 2005-11-22 |
| Probe for the probe card App 20020153913 - Okubo, Masao ; et al. | 2002-10-24 |
| Antimicrobial polymer composition Grant 5,827,524 - Hagiwara , et al. October 27, 1 | 1998-10-27 |
| Antimicrobial polymer composition Grant 5,698,212 - Hagiwara December 16, 1 | 1997-12-16 |
| Antimicrobial composition of aluminosilicate coated silica gel Grant 5,413,789 - Hagiwara , et al. May 9, 1 | 1995-05-09 |
| Silica-gel based antimicrobial composition having an antimicrobial coat of aluminosilicate on the surface of silica gel Grant 5,244,667 - Hagiwara , et al. September 14, 1 | 1993-09-14 |
| Complex probe card for testing a semiconductor wafer Grant 4,523,144 - Okubo , et al. June 11, 1 | 1985-06-11 |
Company Registrations
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