loadpatents
name:-0.017217874526978
name:-0.014741897583008
name:-0.013635873794556
Jao; Jui-Hsiu Patent Filings

Jao; Jui-Hsiu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jao; Jui-Hsiu.The latest application filed is for "semiconductor device with testing structure and method for fabricating the same".

Company Profile
13.14.16
  • Jao; Jui-Hsiu - Taoyuan TW
  • JAO; Jui-Hsiu - TAOYUAN CITY TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor structure with test structure
Grant 11,456,224 - Yang , et al. September 27, 2
2022-09-27
Semiconductor device with testing structure and method for fabricating the same
Grant 11,417,574 - Yang , et al. August 16, 2
2022-08-16
Semiconductor Device With Testing Structure And Method For Fabricating The Same
App 20220139790 - YANG; Tsang-Po ;   et al.
2022-05-05
Semiconductor Structure
App 20220108929 - YANG; TSANG-PO ;   et al.
2022-04-07
Testing fixture and testing assembly
Grant 11,262,398 - Wang , et al. March 1, 2
2022-03-01
Semiconductor Structure
App 20220051955 - YANG; Tsang-Po ;   et al.
2022-02-17
Test array structure, wafer structure and wafer testing method
Grant 11,237,205 - Yang , et al. February 1, 2
2022-02-01
Testing fixture and testing assembly
Grant 11,209,477 - Wang , et al. December 28, 2
2021-12-28
Test Array Structure, Wafer Structure And Wafer Testing Method
App 20210349145 - YANG; Tsang-Po ;   et al.
2021-11-11
Testing structure and testing method
Grant 11,143,690 - Lu , et al. October 12, 2
2021-10-12
Method For Preparing Semiconductor Device
App 20210210391 - HUANG; Chun-Shun ;   et al.
2021-07-08
Semiconductor structure and manufacturing method thereof
Grant 11,024,553 - Yang , et al. June 1, 2
2021-06-01
Testing Fixture And Testing Assembly
App 20210132138 - WANG; Ching-Chung ;   et al.
2021-05-06
Testing Fixture And Testing Assembly
App 20210132139 - WANG; Ching-Chung ;   et al.
2021-05-06
Semiconductor device and method for preparing the same
Grant 10,985,077 - Huang , et al. April 20, 2
2021-04-20
Testing Structure And Testing Method
App 20210102990 - LU; Hsueh-Han ;   et al.
2021-04-08
Semiconductor Structure And Manufacturing Method Thereof
App 20210020527 - YANG; Tsang-Po ;   et al.
2021-01-21
Holder
Grant 10,877,086 - Wang , et al. December 29, 2
2020-12-29
Semiconductor structure and manufacturing method thereof
Grant 10,825,744 - Yang , et al. November 3, 2
2020-11-03
Integrated circuit device
Grant 10,756,693 - Shang , et al. A
2020-08-25
Anti-fuse structure
Grant 10,720,389 - Chang , et al.
2020-07-21
Semiconductor structure
Grant 10,692,811 - Yang , et al.
2020-06-23
Holder
App 20200182926 - WANG; Ching-Chung ;   et al.
2020-06-11
Semiconductor Structure
App 20200176381 - YANG; Tsang-Po ;   et al.
2020-06-04
Semiconductor Device And Method For Preparing The Same
App 20200161191 - HUANG; CHUN-SHUN ;   et al.
2020-05-21
Semiconductor Structure And Manufacturing Method Thereof
App 20200098654 - Yang; Tsang-Po ;   et al.
2020-03-26
Electronic device and electrical testing method thereof
Grant 10,566,253 - Chang , et al. Feb
2020-02-18
Electronic Device And Electrical Testing Method Thereof
App 20190164849 - CHANG; CHIH-YING ;   et al.
2019-05-30
Anti-fuse Structure
App 20190131238 - CHANG; Chih-Ying ;   et al.
2019-05-02
Anti-fuse Structure
App 20190131237 - CHANG; Chih-Ying ;   et al.
2019-05-02

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