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Patent applications and USPTO patent grants for Janko; Bozidar.The latest application filed is for "attention model enhanced video waveform monitor".
Patent | Date |
---|---|
Automatic measurement of video parameters Grant 7,773,112 - Whitling , et al. August 10, 2 | 2010-08-10 |
Streaming media quality analyzer system Grant 7,061,920 - Janko , et al. June 13, 2 | 2006-06-13 |
Attention model enhanced video waveform monitor App 20040207643 - Janko, Bozidar ;   et al. | 2004-10-21 |
Picture quality measurement using blockiness Grant 6,795,580 - Janko , et al. September 21, 2 | 2004-09-21 |
Video editing timeline with measurement results App 20040151469 - Engholm, Kathryn A. ;   et al. | 2004-08-05 |
Picture analyzer with a window interface App 20040150672 - Janko, Bozidar ;   et al. | 2004-08-05 |
Automatic measurement of video parameters App 20040036773 - Whitling, Justin F. ;   et al. | 2004-02-26 |
Image alignment with global translation and linear stretch Grant 6,690,840 - Janko , et al. February 10, 2 | 2004-02-10 |
Blockiness period detection of DCT-based codecs Grant 6,671,409 - Maurer , et al. December 30, 2 | 2003-12-30 |
Frozen field detection of formerly encoded video Grant 6,633,329 - Janko , et al. October 14, 2 | 2003-10-14 |
Streaming media quality analyzer system App 20020150102 - Janko, Bozidar ;   et al. | 2002-10-17 |
Harmonic measurement of blockiness in video signals Grant 6,437,821 - Janko , et al. August 20, 2 | 2002-08-20 |
Frozen field detection of formerly encoded video App 20020105597 - Janko, Bozidar ;   et al. | 2002-08-08 |
Low duty-cycle transport of video reference images Grant 6,075,561 - Janko June 13, 2 | 2000-06-13 |
Attentional maps in objective measurement of video quality degradation Grant 5,940,124 - Janko , et al. August 17, 1 | 1999-08-17 |
Programmable instrument for automatic measurement of compressed video quality Grant 5,818,520 - Janko , et al. October 6, 1 | 1998-10-06 |
Probe with microstrip transmission lines Grant 5,221,895 - Janko , et al. June 22, 1 | 1993-06-22 |
High density probe Grant 5,015,946 - Janko May 14, 1 | 1991-05-14 |
Apparatus for testing a circuit board Grant 4,950,981 - Janko August 21, 1 | 1990-08-21 |
Multiple lead probe for integrated circuits in wafer form Grant 4,891,585 - Janko , et al. January 2, 1 | 1990-01-02 |
Slow-wave high frequency deflection structure Grant 4,207,492 - Tomison , et al. June 10, 1 | 1980-06-10 |
Touch display to digital encoding system Grant 4,110,749 - Janko , et al. August 29, 1 | 1978-08-29 |
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