Janik; Gary

Patent Applications and Registrations

Patent applications and USPTO patent grants for Janik; Gary.The latest application filed is for "configuration parameter management for non-volatile data storage".

Company Profile

1.21.20

Janik; Gary - San Jose CA
Janik; Gary - Palo Alto CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Configuration parameter management for non-volatile data storage Grant 10,332,604 - Peterson , et al.	2019-06-25
Systems and methods for managing storage endurance Grant 10,268,396 - Janik	2019-04-23
System and method for rejuvenating an imaging sensor degraded by exposure to extreme ultraviolet or deep ultraviolet light Grant 10,096,478 - Delgado , et al. October 9, 2	2018-10-09
Configuration Parameter Management For Non-volatile Data Storage App 20180090213 - Peterson; James ; et al.	2018-03-29
Configuration parameter management for non-volatile data storage Grant 9,852,799 - Peterson , et al. December 26, 2	2017-12-26
Systems And Methods For Managing Storage Endurance App 20170351439 - Janik; Gary	2017-12-07
Systems and methods for managing storage endurance Grant 9,766,819 - Janik September 19, 2	2017-09-19
System and method for apodization in a semiconductor device inspection system Grant 9,645,093 - Sullivan , et al. May 9, 2	2017-05-09
Systems And Methods For Managing Storage Endurance App 20160188221 - Janik; Gary	2016-06-30
Configuration Parameter Management For Non-volatile Data Storage App 20160141042 - Peterson; James ; et al.	2016-05-19
System and Method for Apodization in a Semiconductor Device Inspection System App 20160054232 - Sullivan; Jamie M. ; et al.	2016-02-25
System and method for apodization in a semiconductor device inspection system Grant 9,176,069 - Sullivan , et al. November 3, 2	2015-11-03
Determining A Configuration Parameter Using A Soft Read Command App 20150205664 - Janik; Gary ; et al.	2015-07-23
System and Method for Apodization in a Semiconductor Device Inspection System App 20140016125 - Sullivan; Jamie M. ; et al.	2014-01-16
System and Method for Rejuvenating an Imaging Sensor Degraded by Exposure to Extreme Ultraviolet or Deep Ultraviolet Light App 20130295695 - Delgado; Gildardo ; et al.	2013-11-07
Method and apparatus for controlling melt temperature in a Czochralski grower App 20130263772 - Bender; David L. ; et al.	2013-10-10
Crucible weight measurement system for controlling feedstock introduction in Czochralski crystal growth Grant 8,257,496 - Bender , et al. September 4, 2	2012-09-04
Methods For Controlling Melt Temperature In A Czochralski Grower App 20120210931 - Bender; David L. ; et al.	2012-08-23
Systems and methods for measurement of a specimen with vacuum ultraviolet light Grant 7,764,376 - Fielden , et al. July 27, 2	2010-07-27
Systems and methods for measurement of a specimen with vacuum ultraviolet light Grant 7,623,239 - Fielden , et al. November 24, 2	2009-11-24
Systems And Methods For Measurement Of A Specimen With Vacuum Ultraviolet Light App 20090279088 - Fielden; John ; et al.	2009-11-12
Systems and methods for measurement of a specimen with vacuum ultraviolet light Grant 7,564,552 - Fielden , et al. July 21, 2	2009-07-21
Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis Grant 7,495,217 - Gao , et al. February 24, 2	2009-02-24
Systems And Methods For Measurement Of A Specimen With Vacuum Ultraviolet Light App 20080252889 - Fielden; John ; et al.	2008-10-16
Optical system for measuring samples using short wavelength radiation Grant 7,369,233 - Nikoonahad , et al. May 6, 2	2008-05-06
Systems and methods for measurement of a specimen with vacuum ultraviolet light Grant 7,359,052 - Fielden , et al. April 15, 2	2008-04-15
Time-resolved measurement technique using radiation pulses Grant 7,295,325 - Kwak , et al. November 13, 2	2007-11-13
Systems and methods for measuring stress in a specimen Grant 7,274,440 - Janik , et al. September 25, 2	2007-09-25
Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis Grant 7,220,964 - Gao , et al. May 22, 2	2007-05-22
Systems and methods for measurement or analysis of a specimen using separated spectral peaks in light Grant 7,067,819 - Janik June 27, 2	2006-06-27
Systems and methods for measurement of a specimen with vacuum ultraviolet light App 20050254050 - Fielden, John ; et al.	2005-11-17
Systems and methods for measurement or analysis of a specimen using separated spectral peaks in light App 20050253080 - Janik, Gary	2005-11-17
Systems and methods for measurement of a specimen with vacuum ultraviolet light App 20050252752 - Fielden, John ; et al.	2005-11-17
Time-resolved measurement technique using radiation pulses App 20040207850 - Kwak, Hidong ; et al.	2004-10-21
Methods and apparatus for characterizing thin films Grant 6,788,760 - Janik , et al. September 7, 2	2004-09-07
Surface photo-acoustic film measurement device and technique Grant 6,786,099 - Janik September 7, 2	2004-09-07
Optical system for measuring samples using short wavelength radiation App 20040150820 - Nikoonahad, Mehrdad ; et al.	2004-08-05
Method and apparatus for improved x-ray reflection measurement Grant 6,771,735 - Janik , et al. August 3, 2	2004-08-03
Surface photo-acoustic film measurement device and technique App 20030150272 - Janik, Gary	2003-08-14
Method and apparatus for improved x-ray reflection measurement App 20030086533 - Janik, Gary ; et al.	2003-05-08

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