loadpatents
name:-0.076352119445801
name:-0.047608137130737
name:-0.019346237182617
Jak; Martin Jacobus Johan Patent Filings

Jak; Martin Jacobus Johan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jak; Martin Jacobus Johan.The latest application filed is for "metrology method, target and substrate".

Company Profile
17.56.75
  • Jak; Martin Jacobus Johan - 's-Hertogenbosch NL
  • Jak; Martin Jacobus Johan - 's-Hertogenbo ch NL
  • Jak; Martin Jacobus Johan - s-Hertogenbosch NL
  • JAK; MARTIN JACOBUS JOHAN - EINDHOVEN NL
  • Jak; Martin Jacobus Johan - Veldhoven NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Metrology method, target and substrate
Grant 11,428,521 - Bhattacharyya , et al. August 30, 2
2022-08-30
Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method
Grant 11,385,552 - Jak , et al. July 12, 2
2022-07-12
Method to determine a patterning process parameter
Grant 11,300,883 - Jak , et al. April 12, 2
2022-04-12
Metrology Method, Target And Substrate
App 20220057192 - BHATTACHARYYA; Kaustuve ;   et al.
2022-02-24
Metrology method, target and substrate
Grant 11,204,239 - Bhattacharyya , et al. December 21, 2
2021-12-21
Metrology Apparatus And Method For Determining A Characteristic Of One Or More Structures On A Substrate
App 20210325174 - TINNEMANS; Patricius Aloysius Jacobus ;   et al.
2021-10-21
Metrology recipe selection
Grant 11,106,142 - Bhattacharyya , et al. August 31, 2
2021-08-31
Metrology apparatus and method for determining a characteristic of one or more structures on a substrate
Grant 11,009,343 - Tinnemans , et al. May 18, 2
2021-05-18
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
App 20210026256 - JAK; Martin Jacobus Johan ;   et al.
2021-01-28
Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method
Grant 10,831,109 - Jak , et al. November 10, 2
2020-11-10
Metrology Method, Target And Substrate
App 20200348125 - BHATTACHARYYA; Kaustuve ;   et al.
2020-11-05
Metrology method, target and substrate
Grant 10,718,604 - Bhattacharyya , et al.
2020-07-21
Metrology Recipe Selection
App 20200218166 - Bhattacharyya; Kaustuve ;   et al.
2020-07-09
Method of measuring, device manufacturing method, metrology apparatus, and lithographic system
Grant 10,656,534 - Pandey , et al.
2020-05-19
Metrology in lithographic processes
Grant 10,656,533 - Mathijssen , et al.
2020-05-19
Determining edge roughness parameters
Grant 10,634,490 - Jak , et al.
2020-04-28
Correction using stack difference
Grant 10,635,004 - Jiang , et al.
2020-04-28
Metrology method and apparatus
Grant 10,620,550 - Jak , et al.
2020-04-14
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
App 20200050114 - Bozkurt; Murat ;   et al.
2020-02-13
Focus control arrangement and method
Grant 10,551,308 - Jak , et al. Fe
2020-02-04
Metrology recipe selection
Grant 10,527,953 - Bhattacharyya , et al. J
2020-01-07
Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method
Grant 10,481,506 - Bozkurt , et al. Nov
2019-11-19
Metrology Method, Target And Substrate
App 20190346256 - BHATTACHARYYA; Kaustuve ;   et al.
2019-11-14
Method Of Measuring, Device Manufacturing Method, Metrology Apparatus, And Lithographic System
App 20190285993 - PANDEY; Nitesh ;   et al.
2019-09-19
Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate
App 20190265028 - TINNEMANS; Patricius Aloysius Jacobus ;   et al.
2019-08-29
Metrology method, target and substrate
Grant 10,386,176 - Bhattacharyya , et al. A
2019-08-20
Metrology method, target and substrate
Grant 10,379,445 - Jak , et al. A
2019-08-13
Illumination system, inspection apparatus including such an illumination system, inspection method and manufacturing method
Grant 10,338,401 - Van Der Zouw , et al.
2019-07-02
Method of measuring, device manufacturing method, metrology apparatus, and lithographic system
Grant 10,310,389 - Pandey , et al.
2019-06-04
Eye-safe Laser-based Lighting
App 20190165543 - KRIJN; MARCELLINUS PETRUS CAROLUS MICHAEL ;   et al.
2019-05-30
Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus
Grant 10,289,008 - Jak
2019-05-14
Method to Determine a Patterning Process Parameter
App 20190094703 - JAK; Martin Jacobus Johan ;   et al.
2019-03-28
Metrology in Lithographic Processes
App 20190079413 - MATHIJSSEN; Simon Gijsbert Josephus ;   et al.
2019-03-14
Metrology Method And Apparatus
App 20190072859 - JAK; Martin Jacobus Johan ;   et al.
2019-03-07
Metrology Method, Target And Substrate
App 20190064677 - Jak; Martin Jacobus Johan ;   et al.
2019-02-28
Metrology method and apparatus, substrates for use in such methods, lithographic system and device manufacturing method
Grant 10,162,272 - Jak , et al. Dec
2018-12-25
Determining Edge Roughness Parameters
App 20180364036 - JAK; Martin Jacobus Johan ;   et al.
2018-12-20
Metrology method, target and substrate
Grant 10,133,188 - Jak , et al. November 20, 2
2018-11-20
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
App 20180321599 - BOZKURT; Murat ;   et al.
2018-11-08
Method, apparatus and substrates for lithographic metrology
Grant 10,042,268 - Smilde , et al. August 7, 2
2018-08-07
Methods and Apparatus for Predicting Performance of a Measurement Method, Measurement Method and Apparatus
App 20180203367 - JAK; Martin Jacobus Johan
2018-07-19
Method of Measuring a Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
App 20180173112 - JAK; Martin Jacobus Johan ;   et al.
2018-06-21
Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing method
Grant 9,940,703 - Bozkurt , et al. April 10, 2
2018-04-10
Metrology Recipe Selection
App 20180088470 - BHATTACHARYYA; Kaustuve ;   et al.
2018-03-29
Illumination System, Inspection Apparatus Including Such an Illumination System, Inspection Method and Manufacturing Method
App 20180088347 - Van Der Zouw; Gerbrand ;   et al.
2018-03-29
Metrology method and apparatus, substrate, lithographic system and device manufacturing method
Grant 9,811,003 - Jak , et al. November 7, 2
2017-11-07
Liquid crystal display system and method
Grant 9,805,666 - Hoppenbrouwers , et al. October 31, 2
2017-10-31
Illumination system, inspection apparatus including such an illumination system, inspection method and manufacturing method
Grant 9,753,296 - Van Der Zouw , et al. September 5, 2
2017-09-05
Spectral purity filter
Grant 9,726,989 - Soer , et al. August 8, 2
2017-08-08
Method of Measuring a Property of a Target Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
App 20170206649 - BOZKURT; Murat ;   et al.
2017-07-20
Metrology Method, Target And Substrate
App 20170184977 - JAK; Martin Jacobus Johan ;   et al.
2017-06-29
Focus Control Arrangement And Method
App 20170176328 - JAK; Martin Jacobus Johan ;   et al.
2017-06-22
Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing method
Grant 9,633,427 - Bozkurt , et al. April 25, 2
2017-04-25
Metrology Method and Apparatus, Substrate, Lithographic System and Device Manufacturing Method
App 20170068173 - JAK; Martin Jacobus Johan ;   et al.
2017-03-09
Metrology Method And Apparatus, Substrates For Use In Such Methods, Lithographic System And Device Manufacturing Method
App 20170052454 - JAK; Martin Jacobus Johan ;   et al.
2017-02-23
Metrology method and apparatus, substrate, lithographic system and device manufacturing method
Grant 9,535,338 - Jak , et al. January 3, 2
2017-01-03
Method, Apparatus and Substrates for Lithographic Metrology
App 20160291481 - SMILDE; Hendrik Jan Hidde ;   et al.
2016-10-06
Method of Measuring a Property of a Target Structure, Inspection Apparatus, Lithographic System and Device Manufacturing Method
App 20160086324 - BOZKURT; Murat ;   et al.
2016-03-24
Metrology Method, Target And Substrate
App 20160061589 - BHATTACHARYYA; Kaustuve ;   et al.
2016-03-03
Illumination System, Inspection Apparatus Including Such an Illumination System, Inspection Method and Manufacturing Method
App 20160025992 - VAN DER ZOUW; Gerbrand ;   et al.
2016-01-28
Eye-safe Laser-based Lighting
App 20150380899 - KRIJN; Marcellinus Petrus Carolus Michael ;   et al.
2015-12-31
Spectral purity filter, radiation source, lithographic apparatus, and device manufacturing method
Grant 9,195,144 - Jak , et al. November 24, 2
2015-11-24
Spectral purity filter, lithographic apparatus, and method for manufacturing a spectral purity filter
Grant 9,195,152 - Soer , et al. November 24, 2
2015-11-24
Device manufacturing method and associated lithographic apparatus, inspection apparatus, and lithographic processing cell
Grant 9,163,935 - Den Boef , et al. October 20, 2
2015-10-20
Spectral purity filters for use in a lithographic apparatus
Grant 9,041,912 - Soer , et al. May 26, 2
2015-05-26
Metrology Method and Apparatus, Substrate, Lithographic System and Device Manufacturing Method
App 20150138523 - Jak; Martin Jacobus Johan ;   et al.
2015-05-21
Spectral purity filter, lithographic apparatus, and method for manufacturing a spectral purity filter
Grant 8,817,237 - Soer , et al. August 26, 2
2014-08-26
Radiation source with cleaning apparatus
Grant 8,742,381 - Banine , et al. June 3, 2
2014-06-03
Radiation Source With Cleaning Apparatus
App 20130161542 - BANINE; Vadim Yevgenyevich ;   et al.
2013-06-27
Device Manufacturing Method and Associated Lithographic Apparatus, Inspection Apparatus, and Lithographic Processing Cell
App 20130148121 - DEN BOEF; Arie Jeffrey ;   et al.
2013-06-13
Light output device with partly transparent mirror
Grant 8,459,830 - Van Gorkom , et al. June 11, 2
2013-06-11
Components for EUV Lithographic Apparatus, EUV Lithographic Apparatus Including Such Components and Method for Manufacturing Such Components
App 20130114059 - Jak; Martin Jacobus Johan ;   et al.
2013-05-09
Method for removing a deposition on an uncapped multilayer mirror of a lithographic apparatus, lithographic apparatus and device manufacturing method
Grant 8,405,051 - Banine , et al. March 26, 2
2013-03-26
Photo-detector and method of measuring light
Grant 8,400,627 - Jak , et al. March 19, 2
2013-03-19
Spectral purity filters for use in a lithographic apparatus
Grant 8,390,788 - Soer , et al. March 5, 2
2013-03-05
Spectral Purity Filter
App 20130038926 - Soer; Wouter Anthon ;   et al.
2013-02-14
Spectral Purity Filters for Use in a Lithographic Apparatus
App 20130010363 - Soer; Wouter Anthon ;   et al.
2013-01-10
Radiation source
Grant 8,263,950 - Soer , et al. September 11, 2
2012-09-11
Spectrum sequential display having reduced cross talk
Grant 8,248,393 - Hekstra , et al. August 21, 2
2012-08-21
Spectral Purity Filter, Lithographic Apparatus, And Device Manufacturing Method
App 20120182537 - Yakunin; Andrei Mikhailovich ;   et al.
2012-07-19
Spectral Purity Filter, Lithographic Apparatus, And Method For Manufacturing A Spectral Purity Filter
App 20120154778 - Soer; Wouter Anthon ;   et al.
2012-06-21
Spectral Purity Filter, Lithographic Apparatus, And Method For Manufacturing A Spectral Purity Filter
App 20120154779 - Soer; Wouter Anthon ;   et al.
2012-06-21
Spectral Purity Filter, Lithographic Apparatus, And Method For Manufacturing A Spectral Purity Filter
App 20120147351 - Jak; Martin Jacobus Johan ;   et al.
2012-06-14
System and method for controlling lighting systems
Grant 8,189,011 - Van de Sluis , et al. May 29, 2
2012-05-29
Anti-blur Apparatus For E.g. Backlight Of Liquid Crystal Display
App 20120127368 - Jak; Martin Jacobus Johan ;   et al.
2012-05-24
Lighting Device
App 20110228555 - Van Gorkom; Ramon Pascal ;   et al.
2011-09-22
Spectral Purity Filter, Radiation Source, Lithographic Apparatus, and Device Manufacturing Method
App 20110211185 - Jak; Martin Jacobus Johan ;   et al.
2011-09-01
Spectral Purity Filter, Lithographic Apparatus, And Method For Manufacturing A Spectral Purity Filter
App 20110164237 - Soer; Wouter Anthon ;   et al.
2011-07-07
Spectral Purity Filter, Lithographic Apparatus Including Such A Spectral Purity Filter And Device Manufacturing Method
App 20110157573 - Soer; Wouter Anthon ;   et al.
2011-06-30
Radiation Source
App 20110128519 - SOER; Wouter Anthon ;   et al.
2011-06-02
Radiation source and lithographic apparatus
Grant 7,952,084 - Soer , et al. May 31, 2
2011-05-31
Eye-safe Laser-based Lighting
App 20110116520 - Krijn; Marcellinus Petrus Carolus Michael ;   et al.
2011-05-19
Method For Removing A Deposition On An Uncapped Multilayer Mirror Of A Lithographic Apparatus, Lithographic Apparatus And Device Manufacturing Method
App 20110117504 - Banine; Vadim Yevgenyevich ;   et al.
2011-05-19
Light Output Device And Method
App 20110075420 - Van Gorkom; Ramon Pascal ;   et al.
2011-03-31
Spectral Purity Filters For Use In A Lithographic Apparatus
App 20110043782 - Soer; Wouter Anthon ;   et al.
2011-02-24
Spectral Purity Filters For Use In A Lithographic Apparatus
App 20110044425 - Jak; Martin Jacobus Johan ;   et al.
2011-02-24
Photo-detector And Method Of Measuring Light
App 20110007306 - Jak; Martin Jacobus Johan ;   et al.
2011-01-13
Spectral Purity Filter, Lithographic Apparatus, And Method For Manufacturing A Spectral Purity Filter
App 20100328639 - Jak; Martin Jacobus Johan ;   et al.
2010-12-30
Lithographic Radiation Source, Collector, Apparatus And Method
App 20100271610 - SOER; Wouter Anthon ;   et al.
2010-10-28
Liquid Crystal Display System And Method
App 20100060672 - Hoppenbrouwers; Jurgen Jean Louis ;   et al.
2010-03-11
Illumination System And Display Device
App 20100053992 - Krijn; Marcellinus Petrus Carolus Michael ;   et al.
2010-03-04
Spectral Purity Filters for Use in a Lithographic Apparatus
App 20100020304 - Soer; Wouter Anthon ;   et al.
2010-01-28
Display Device And Method
App 20100002027 - Krijn; Marcellinus Petrus Carolus Michael ;   et al.
2010-01-07
Radiation Source And Lithographic Apparatus
App 20090272916 - SOER; Wouter Anthon ;   et al.
2009-11-05
System and Method for Controlling Lighting Systems
App 20080265802 - Van de Sluis; Bartel Marinus ;   et al.
2008-10-30
Image Display Apparatus
App 20080252822 - De Koning; Hendrik ;   et al.
2008-10-16
Color display device
Grant 7,430,022 - Hekstra , et al. September 30, 2
2008-09-30
Spectrum Sequential Display Having Reduced Cross Talk
App 20080211973 - Hekstra; Gerben Johan ;   et al.
2008-09-04
Method for Photo-Embossing a Monomer-Containing Layer
App 20070254208 - Kurt; Ralph ;   et al.
2007-11-01
Color display device
App 20070146509 - Hekstra; Gerben Johan ;   et al.
2007-06-28
Device with light-guiding layer
App 20060290683 - Pasquariello; Donato ;   et al.
2006-12-28
Coordinate detection system for a display monitor
App 20060290684 - Giraldo; Andrea ;   et al.
2006-12-28
Front light for diffusely reflecting displays
App 20060262568 - Blom; Saskia Maria Petrouchka ;   et al.
2006-11-23
Display device and an illumination system therefor
App 20060256244 - Jak; Martin Jacobus Johan ;   et al.
2006-11-16
Collimated scanning backlight device
App 20060215074 - Jak; Martin Jacobus Johan ;   et al.
2006-09-28
Active matrix display with a scanning backlight
App 20060170645 - Fisekovic; Nebojsa ;   et al.
2006-08-03
Electrophoretic display panel
App 20050231460 - Zhou, Guofu ;   et al.
2005-10-20

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