Jairath; Rahul

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jairath; Rahul.The latest application filed is for "data platform and analytics for predicting media metrics".

Company Profile

2.17.5

Jairath; Rahul - New Delhi IN
Jairath, Rahul - San Jose CA
Jairath; Rahul - Austin TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Data platform and analytics for predicting media metrics Grant 10,762,524 - Poynter , et al. Sep	2020-09-01
Data Platform And Analytics For Predicting Media Metrics App 20200034873 - Poynter; Nicola Sarah Vanessa ; et al.	2020-01-30
Integrated pad and belt for chemical mechanical polishing App 20050118936 - Pant, Anil K. ; et al.	2005-06-02
Plating method and apparatus using contactless electrode Grant 6,855,239 - Jairath February 15, 2	2005-02-15
Integrated pad and belt for chemical mechanical polishing Grant 6,656,025 - Pant , et al. December 2, 2	2003-12-02
Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing Grant 6,621,584 - Pecen , et al. September 16, 2	2003-09-16
Method of transporting a semiconductor wafer in a wafer polishing system Grant 6,517,418 - Engdahl , et al. February 11, 2	2003-02-11
Method and apparatus for in-situ monitoring of thickness during chemical -mechanical polishing App 20020089676 - Pecen, Jiri ; et al.	2002-07-11
System and method for creating and navigating a linear hypermedia resource program App 20020031988 - Pant, Anil K. ; et al.	2002-03-14
Integrated pad and belt for chemical mechanical polishing Grant 6,328,642 - Pant , et al. December 11, 2	2001-12-11
Method of transporting a semiconductor wafer in a wafer polishing system App 20010039168 - Engdahl, Erik H. ; et al.	2001-11-08
Method and apparatus for in-situ end-point detection and optimization of a chemical-mechanical polishing process using a linear polisher Grant 6,261,155 - Jairath , et al. July 17, 2	2001-07-17
Method and apparatus for in-situ end-point detection and optimization of a chemical-mechanical polishing process using a linear polisher Grant 6,146,248 - Jairath , et al. November 14, 2	2000-11-14
Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing Grant 6,111,634 - Pecen , et al. August 29, 2	2000-08-29
Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing Grant 6,108,091 - Pecen , et al. August 22, 2	2000-08-22
Method for dressing a polishing pad during polishing of a semiconductor wafer Grant 5,913,714 - Volodarsky , et al. June 22, 1	1999-06-22
Slurry formulation for chemical mechanical polishing of metals Grant 5,866,031 - Carpio , et al. February 2, 1	1999-02-02
Wafer polishing head with pad dressing element Grant 5,857,899 - Volodarsky , et al. January 12, 1	1999-01-12
Sensors for a linear polisher Grant 5,762,536 - Pant , et al. June 9, 1	1998-06-09
Method and apparatus for polishing a semiconductor substrate wafer Grant 5,688,360 - Jairath November 18, 1	1997-11-18
Method of using additives with silica-based slurries to enhance selectivity in metal CMP Grant 5,614,444 - Farkas , et al. March 25, 1	1997-03-25
Point of use slurry dispensing system Grant 5,478,435 - Murphy , et al. December 26, 1	1995-12-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.