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Patent applications and USPTO patent grants for JAIN; Vivek Kumar.The latest application filed is for "determining hot spot ranking based on wafer measurement".
Patent | Date |
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Determining Hot Spot Ranking Based On Wafer Measurement App 20220035256 - ZHANG; Youping ;   et al. | 2022-02-03 |
Process Variability Aware Adaptive Inspection And Metrology App 20210255548 - VELLANKI; Venugopal ;   et al. | 2021-08-19 |
Method And Apparatus For Pattern Fidelity Control App 20210181642 - HASAN; Tanbir ;   et al. | 2021-06-17 |
Process variability aware adaptive inspection and metrology Grant 11,003,093 - Vellanki , et al. May 11, 2 | 2021-05-11 |
Method and apparatus for pattern fidelity control Grant 10,908,515 - Hasan , et al. February 2, 2 | 2021-02-02 |
Methods for defect validation Grant 10,859,926 - Hunsche , et al. December 8, 2 | 2020-12-08 |
Process Variability Aware Adaptive Inspection And Metrology App 20200096871 - VELLANKI; Venugopal ;   et al. | 2020-03-26 |
Method And Apparatus For Pattern Fidelity Control App 20200019069 - HASAN; Tanbir ;   et al. | 2020-01-16 |
Process variability aware adaptive inspection and metrology Grant 10,514,614 - Vellanki , et al. Dec | 2019-12-24 |
Methods For Defect Validation App 20180173104 - HUNSCHE; Stefan ;   et al. | 2018-06-21 |
Process Variability Aware Adaptive Inspection And Metrology App 20180031981 - VELLANKI; Venugopal ;   et al. | 2018-02-01 |
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