loadpatents
name:-0.0067481994628906
name:-0.0037870407104492
name:-0.00040388107299805
Izuru; Hitoshi Patent Filings

Izuru; Hitoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Izuru; Hitoshi.The latest application filed is for "semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor device".

Company Profile
0.2.4
  • Izuru; Hitoshi - Kawasaki JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor integrated circuit device and test method thereof
Grant 7,915,720 - Tashiro , et al. March 29, 2
2011-03-29
Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor device
App 20080227226 - Fujii; Shigeru ;   et al.
2008-09-18
Semiconductor integrated circuit device and test method thereof
App 20070170425 - Tashiro; Kazuhiro ;   et al.
2007-07-26
Semiconductor device testing method and testing equipment
Grant 7,199,600 - Izuru , et al. April 3, 2
2007-04-03
Semiconductor substrate, manufacturing method of a semiconductor device and testing method of a semiconductor device
App 20060097356 - Fujii; Shigeru ;   et al.
2006-05-11
Semiconductor device testing method and testing equipment
App 20060061379 - Izuru; Hitoshi ;   et al.
2006-03-23

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