Iyoki; Masato

Patent Applications and Registrations

Patent applications and USPTO patent grants for Iyoki; Masato.The latest application filed is for "scanning probe microscope".

Company Profile

0.19.17

Iyoki; Masato - Minato-ku JP
Iyoki; Masato - Chiba N/A JP
Iyoki; Masato - Chiba-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scanning probe microscope Grant 8,813,261 - Iyoki , et al. August 19, 2	2014-08-19
Scanning Probe Microscope App 20140059724 - Iyoki; Masato ; et al.	2014-02-27
Cantilever for scanning probe microscope and scanning probe microscope equipped with it Grant 8,601,608 - Maruyama , et al. December 3, 2	2013-12-03
Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever Grant 8,214,915 - Shigeno , et al. July 3, 2	2012-07-03
Self displacement sensing cantilever and scanning probe microscope Grant 8,161,568 - Iyoki , et al. April 17, 2	2012-04-17
Piezoelectric actuator provided with a displacement meter, piezoelectric element, and positioning device Grant 8,115,367 - Iyoki February 14, 2	2012-02-14
Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those Grant 8,058,780 - Iyoki November 15, 2	2011-11-15
Approach method for probe and sample in scanning probe microscope Grant 8,024,816 - Iyoki , et al. September 20, 2	2011-09-20
Optical displacement detection mechanism and surface information measurement device using the same Grant 7,973,942 - Iyoki , et al. July 5, 2	2011-07-05
Sensor for observations in liquid environments and observation apparatus for use in liquid environments Grant 7,945,965 - Watanabe , et al. May 17, 2	2011-05-17
Optical displacement-detecting mechanism and probe microscope using the same Grant 7,787,133 - Iyoki , et al. August 31, 2	2010-08-31
Approach Method For Probe And Sample In Scanning Probe Microscope App 20100205697 - Iyoki; Masato ; et al.	2010-08-12
Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It App 20100154085 - Maruyama; Kenichi ; et al.	2010-06-17
Self displacement sensing cantilever and scanning probe microscope App 20100132075 - Iyoki; Masato ; et al.	2010-05-27
Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever App 20100107284 - Shigeno; Masatsugu ; et al.	2010-04-29
Scanning probe microscope fine-movement mechanism and scanning probe microscope using same Grant 7,614,288 - Iyoki , et al. November 10, 2	2009-11-10
Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same Grant 7,614,287 - Iyoki , et al. November 10, 2	2009-11-10
Sensor For Observations In Liquid Environments And Observation Apparatus For Use In Liquid Environments App 20090265819 - Watanabe; Naoya ; et al.	2009-10-22
Vibration-type cantilever holder and scanning probe microscope Grant 7,605,368 - Shigeno , et al. October 20, 2	2009-10-20
Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those App 20090206707 - Iyoki; Masato	2009-08-20
Piezoelectric Actuator Provided With A Displacement Meter, Piezoelectric Element Used Therefor, And Positioning Device Using A Piezoelectric Actuator App 20090189485 - Iyoki; Masato	2009-07-30
Scanning Probe Microscope Fine-Movement Mechanism and Scanning Probe Microscope Using Same App 20080061232 - Iyoki; Masato ; et al.	2008-03-13
Scanning Probe Microscope Displacement Detecting Mechanism And Scanning Probe Microscope Using Same App 20080048115 - Iyoki; Masato ; et al.	2008-02-28
Optical Displacement-detecting Mechanism And Probe Microscope Using The Same App 20080049223 - Iyoki; Masato ; et al.	2008-02-28
Optical Displacement Detection Mechanism and Surface Information Measurement Device Using the Same App 20080049236 - Iyoki; Masato ; et al.	2008-02-28
Fine-adjustment mechanism for scanning probe microscopy Grant 7,288,762 - Iyoki , et al. October 30, 2	2007-10-30
Method of manufacturing light-propagating probe for near-field microscope Grant 7,282,157 - Chiba , et al. October 16, 2	2007-10-16
Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe Grant 7,241,987 - Saito , et al. July 10, 2	2007-07-10
Vibration-type cantilever holder and scanning probe microscope App 20070104079 - Shigeno; Masatsugu ; et al.	2007-05-10
Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder Grant 7,170,054 - Iyoki , et al. January 30, 2	2007-01-30
Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder App 20060043290 - Iyoki; Masato ; et al.	2006-03-02
Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe App 20060043276 - Saito; Yuika ; et al.	2006-03-02
Fine-adjustment mechanism for scanning probe microscopy App 20050231066 - Iyoki, Masato ; et al.	2005-10-20
Method of manufacturing light-propagating probe for near-field microscope App 20040126073 - Chiba, Norio ; et al.	2004-07-01
Scanning probe microscope having piezoelectric member for controlling movement of probe Grant 6,257,053 - Tomita , et al. July 10, 2	2001-07-10

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