Iwata; Hisafumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Iwata; Hisafumi.The latest application filed is for "defect inspection system".

Company Profile

0.16.11

Iwata; Hisafumi - Hayama JP
Iwata; Hisafumi - Hayama-machi JP
Iwata; Hisafumi - Kanagawa-ken JP
Iwata; Hisafumi - Tokyo JP
Iwata; Hisafumi - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect inspection system Grant 8,804,109 - Aiko , et al. August 12, 2	2014-08-12
Defect Inspection System App 20130182100 - AIKO; Kenji ; et al.	2013-07-18
Inspecting method, inspecting system, and method for manufacturing electronic devices Grant 8,428,336 - Ikeda , et al. April 23, 2	2013-04-23
Defect inspection system Grant 8,319,960 - Aiko , et al. November 27, 2	2012-11-27
Defect Inspection System App 20100271473 - AIKO; Kenji ; et al.	2010-10-28
Defect inspection system Grant 7,733,474 - Aiko , et al. June 8, 2	2010-06-08
Defect inspection system App 20080291436 - Aiko; Kenji ; et al.	2008-11-27
Method and apparatus for detecting defects Grant 7,426,023 - Ohshima , et al. September 16, 2	2008-09-16
Inspecting method, inspecting system, and method for manufacturing electronic devices App 20060274932 - Ikeda; Yoko ; et al.	2006-12-07
Method and apparatus for detecting defects App 20060139629 - Ohshima; Yoshimasa ; et al.	2006-06-29
Inspecting method, inspecting system, and method for manufacturing electronic devices Grant 7,068,834 - Ikeda , et al. June 27, 2	2006-06-27
Method and apparatus for detecting defects App 20050264797 - Nakano, Hiroyuki ; et al.	2005-12-01
Inspection condition setting program, inspection device and inspection system App 20050195396 - Ono, Makoto ; et al.	2005-09-08
Inspection condition setting program, inspection device and inspection system Grant 6,928,375 - Ono , et al. August 9, 2	2005-08-09
Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device Grant 6,826,735 - Ono , et al. November 30, 2	2004-11-30
Inspection system and semiconductor device manufacturing method Grant 6,775,817 - Ono , et al. August 10, 2	2004-08-10
Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices Grant 6,687,633 - Ono , et al. February 3, 2	2004-02-03
Inspection condition setting program, inspection device and inspection system App 20030195712 - Ono, Makoto ; et al.	2003-10-16
Inspection system and method for manufacturing electronic devices using the inspection system Grant 6,611,728 - Morioka , et al. August 26, 2	2003-08-26
Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device App 20030058436 - Ono, Makoto ; et al.	2003-03-27
Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices App 20020143483 - Ono, Makoto ; et al.	2002-10-03
Inspection system and semiconductor device manufacturing method App 20020052053 - Ono, Makoto ; et al.	2002-05-02
Pattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure system Grant 5,684,565 - Oshida , et al. November 4, 1	1997-11-04
Method and apparatus for the inspection of defects Grant 5,293,538 - Iwata , et al. March 8, 1	1994-03-08
Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate Grant 5,278,012 - Yamanaka , et al. January 11, 1	1994-01-11
Method of aligning and bonding tab inner leads Grant 5,059,559 - Takahashi , et al. October 22, 1	1991-10-22

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.