Iwasaki; Mayuka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Iwasaki; Mayuka.The latest application filed is for "electron microscope system and method for evaluating film thickness reduction of resist patterns".

Company Profile

0.8.6

Iwasaki; Mayuka - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electron microscope system and method for evaluating film thickness reduction of resist patterns Grant 8,502,145 - Iwasaki , et al. August 6, 2	2013-08-06
Charged particle beam device Grant 8,357,897 - Shishido , et al. January 22, 2	2013-01-22
Electron Microscope System And Method For Evaluating Film Thickness Reduction Of Resist Patterns App 20120267529 - Iwasaki; Mayuka ; et al.	2012-10-25
Electron microscope system and method for evaluating film thickness reduction of resist patterns Grant 8,217,348 - Iwasaki , et al. July 10, 2	2012-07-10
Charged Particle Beam Device App 20120104254 - Shishido; Chie ; et al.	2012-05-03
Method and apparatus for measuring dimension using electron microscope Grant 7,817,860 - Shishido , et al. October 19, 2	2010-10-19
Method And Apparatus For Measuring Dimension Using Electron Microscope App 20090224152 - SHISHIDO; Chie ; et al.	2009-09-10
Electron Microscope System and Method for Evaluating Film Thickness Reduction of Resist Patterns App 20090212211 - IWASAKI; Mayuka ; et al.	2009-08-27
Method and apparatus for measuring dimension using electron microscope Grant 7,460,714 - Shishido , et al. December 2, 2	2008-12-02
Method and apparatus for measuring dimension using electron microscope App 20070286494 - Shishido; Chie ; et al.	2007-12-13
Method and apparatus for measuring dimension using electron microscope Grant 7,269,287 - Shishido , et al. September 11, 2	2007-09-11
Method And Apparatus For Measuring Dimension Using Electron Microscope App 20070092130 - Shishido; Chie ; et al.	2007-04-26

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