Iwasaki; Kouji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Iwasaki; Kouji.The latest application filed is for "micro cross-section processing method".

Company Profile

0.22.22

Iwasaki; Kouji - Chiba JP
Iwasaki; Kouji - Chiba-shi JP
Iwasaki; Kouji - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus Grant 8,657,962 - Hayashi , et al. February 25, 2	2014-02-25
Focused ion beam system and sample processing method using the same Grant 8,581,206 - Man , et al. November 12, 2	2013-11-12
Micro cross-section processing method Grant 8,304,721 - Iwasaki , et al. November 6, 2	2012-11-06
Composite focused ion beam device, and processing observation method and processing method using the same Grant 8,269,194 - Kaito , et al. September 18, 2	2012-09-18
Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope Grant 8,191,168 - Man , et al. May 29, 2	2012-05-29
Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same Grant 7,973,280 - Takahashi , et al. July 5, 2	2011-07-05
Focused Ion Beam System And Sample Processing Method Using The Same App 20100213386 - Man; Xin ; et al.	2010-08-26
Micro Cross-section Processing Method App 20100215868 - Iwasaki; Kouji ; et al.	2010-08-26
Composite Focused Ion Beam Device, And Processing Observation Method And Processing Method Using The Same App 20100176296 - Kaito; Takashi ; et al.	2010-07-15
Nanobio device of imitative anatomy structure Grant 7,736,893 - Munekane , et al. June 15, 2	2010-06-15
Focused ion beam apparatus and method of preparing/observing sample Grant 7,626,165 - Iwasaki December 1, 2	2009-12-01
Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same App 20090206254 - Takahashi; Haruo ; et al.	2009-08-20
Method Of Preparing A Transmission Electron Microscope Sample And A Sample Piece For A Transmission Electron Microscope App 20090119807 - Man; Xin ; et al.	2009-05-07
Charged Particle Beam Apparatus App 20080265158 - Iwasaki; Kouji	2008-10-30
Charged particle beam apparatus Grant 7,442,942 - Takahashi , et al. October 28, 2	2008-10-28
Probe and small sample pick up mechanism Grant 7,404,339 - Munekane , et al. July 29, 2	2008-07-29
Focused ion beam apparatus and method of preparing/observing sample App 20080073586 - Iwasaki; Kouji	2008-03-27
Sample support prepared by semiconductor silicon process technique Grant 7,345,289 - Iwasaki , et al. March 18, 2	2008-03-18
Ion beam device and ion beam processing method, and holder member Grant 7,297,944 - Kodama , et al. November 20, 2	2007-11-20
Ion beam device and ion beam processing method Grant 7,276,691 - Kodama , et al. October 2, 2	2007-10-02
Method and system for fabricating three-dimensional microstructure Grant 7,267,731 - Iwasaki September 11, 2	2007-09-11
Clock Grant D545,693 - Iwasaki July 3, 2	2007-07-03
Charged particle beam apparatus App 20070045560 - Takahashi; Haruo ; et al.	2007-03-01
Sample support prepared by semiconductor silicon process technique App 20060189021 - Iwasaki; Kouji ; et al.	2006-08-24
Nanobio device of imitative anatomy structure App 20060188946 - Munekane; Masanao ; et al.	2006-08-24
Ion beam device and ion beam processing method App 20060163497 - Kodama; Toshio ; et al.	2006-07-27
Micro-sample pick-up apparatus and micro-sample pick-up method Grant 7,067,823 - Iwasaki , et al. June 27, 2	2006-06-27
EPL mask processing method and device thereof Grant 7,060,397 - Yamamoto , et al. June 13, 2	2006-06-13
Thin specimen producing method and apparatus Grant 7,002,150 - Iwasaki , et al. February 21, 2	2006-02-21
Probe and small sample pick up mechanism App 20060010968 - Munekane; Masanao ; et al.	2006-01-19
Ion beam device and ion beam processing method, and holder member App 20050236587 - Kodama, Toshio ; et al.	2005-10-27
Minute three dimensional structure producing apparatus and method App 20050211922 - Munekane, Masanao ; et al.	2005-09-29
Focused charged particle beam apparatus App 20050035306 - Iwasaki, Kouji	2005-02-17
Ion beam apparatus, ion beam processing method and sample holder member Grant 6,838,685 - Kodama , et al. January 4, 2	2005-01-04
Micro-sample pick-up apparatus and micro-sample pick-up method App 20040246465 - Iwasaki, Kouji ; et al.	2004-12-09
Thin specimen producing method and apparatus App 20040245464 - Iwasaki, Kouji ; et al.	2004-12-09
Electrochemical cell App 20040209163 - Watanabe, Shunji ; et al.	2004-10-21
Method and system for surface or cross-sectional processing and observation App 20040154744 - Kaito, Takashi ; et al.	2004-08-12
Method and system for fabricating three-diemensional microstructure App 20040129351 - Iwasaki, Kouji	2004-07-08
EPL mask processing method and device thereof App 20030232258 - Yamamoto, Yo ; et al.	2003-12-18
Ion beam processing position correction method Grant 6,593,583 - Iwasaki July 15, 2	2003-07-15
Ion beam processing position correction method App 20010032936 - Iwasaki, Kouji	2001-10-25

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