loadpatents
name:-0.019488096237183
name:-0.021667957305908
name:-0.0067141056060791
Iwasaki; Hidekazu Patent Filings

Iwasaki; Hidekazu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Iwasaki; Hidekazu.The latest application filed is for "carbon dioxide adsorbent and carbon dioxide processing system".

Company Profile
5.16.15
  • Iwasaki; Hidekazu - Tokyo JP
  • IWASAKI; Hidekazu - Kobe-shi JP
  • Iwasaki; Hidekazu - Kobe JP
  • Iwasaki; Hidekazu - Gunma JP
  • Iwasaki; Hidekazu - Takasaki JP
  • IWASAKI; Hidekazu - Takasaki-shi JP
  • Iwasaki; Hidekazu - Sanda JP
  • Iwasaki; Hidekazu - Itami JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Contact probe and inspection socket provided with contact probe
Grant 11,394,148 - Iwasaki , et al. July 19, 2
2022-07-19
Carbon Dioxide Adsorbent And Carbon Dioxide Processing System
App 20220040667 - OKUMURA; Takeshi ;   et al.
2022-02-10
Carbon dioxide adsorbent, method for manufacturing the same, and carbon dioxide processing system
Grant 11,185,842 - Okumura , et al. November 30, 2
2021-11-30
Contact Probe And Inspection Socket Provided With Contact Probe
App 20210336365 - Iwasaki; Hidekazu ;   et al.
2021-10-28
Gas engine system
Grant 10,724,495 - Hirayama , et al.
2020-07-28
Method of manufacturing semiconductor device
Grant 10,551,432 - Ishii , et al. Fe
2020-02-04
Carbon Dioxide Adsorbent, Method For Manufacturing The Same, And Carbon Dioxide Processing System
App 20190126235 - OKUMURA; Takeshi ;   et al.
2019-05-02
Carbon Dioxide Recovery System And Carbon Dioxide Separation And Recovery System
App 20190046920 - NISHIBE; Shohei ;   et al.
2019-02-14
Gas Engine System
App 20180372055 - HIRAYAMA; Towa ;   et al.
2018-12-27
Method Of Manufacturing Semiconductor Device
App 20180340976 - ISHII; Toshitsugu ;   et al.
2018-11-29
Semiconductor device manufacturing method and semiconductor device
Grant 10,109,568 - Matsuhashi , et al. October 23, 2
2018-10-23
Semiconductor device manufacturing method
Grant 9,945,903 - Ishii , et al. April 17, 2
2018-04-17
Semiconductor Device Manufacturing Method And Semiconductor Device
App 20180102310 - MATSUHASHI; Jun ;   et al.
2018-04-12
Method of manufacturing a semiconductor device and inspecting an electrical characteristic thereof using test socket terminals
Grant 9,905,482 - Ishii , et al. February 27, 2
2018-02-27
Method Of Manufacturing Semiconductor Device
App 20170338159 - Ishii; Toshitsugu ;   et al.
2017-11-23
Fuel supply controlling device for divided-chamber gas engine
Grant 9,816,449 - Miyamoto , et al. November 14, 2
2017-11-14
Method of manufacturing a semiconductor device and inspecting an electrical characteristic thereof using socket terminals
Grant 9,761,501 - Ishii , et al. September 12, 2
2017-09-12
Semiconductor Device Manufacturing Method
App 20170025318 - ISHII; Toshitsugu ;   et al.
2017-01-26
Method for manufacturing semiconductor device
Grant 9,515,000 - Ishii , et al. December 6, 2
2016-12-06
Method for Manufacturing Semiconductor Device
App 20160141215 - ISHII; Toshitsugu ;   et al.
2016-05-19
Gas engine, control system and control method for gas engine
Grant 9,291,125 - Yoshihara , et al. March 22, 2
2016-03-22
Method Of Manufacturing Semiconductor Device
App 20160064291 - Ishii; Toshitsugu ;   et al.
2016-03-03
Fuel Supply Controlling Device For Divided-chamber Gas Engine
App 20150267631 - Miyamoto; Sekai ;   et al.
2015-09-24
Gas Engine, Control System And Control Method For Gas Engine
App 20140102403 - Yoshihara; Shintaro ;   et al.
2014-04-17
Cooling structure for gas turbine combustor
Grant 8,220,273 - Iwasaki July 17, 2
2012-07-17
Cooling Structure For Gas Turbine Combustor
App 20110016869 - IWASAKI; Hidekazu
2011-01-27
Partly replaceable device for testing a multi-contact integrated circuit chip package
Grant 5,847,572 - Iwasaki , et al. December 8, 1
1998-12-08
Socket apparatus
Grant 5,658,153 - Ikeya , et al. August 19, 1
1997-08-19
Testing apparatus for semiconductor devices
Grant 4,904,934 - Nishihashi , et al. February 27, 1
1990-02-27

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