Iwamoto; Katsuya
Patent Applications and Registrations
Patent applications and USPTO patent grants for Iwamoto; Katsuya.The latest application filed is for "film thickness measuring method and film thickness measuring device".
- Iwamoto; Katsuya - Nogoya JP
- IWAMOTO; Katsuya - Nagoya-shi JP
| Patent | Date |
|---|---|
| Film thickness measuring method and film thickness measuring device Grant 10,690,480 - Kondo , et al. | 2020-06-23 |
| Film Thickness Measuring Method And Film Thickness Measuring Device App 20190017807 - KONDO; Koji ; et al. | 2019-01-17 |
| Gas Spring App 20100201052 - Katayama; Takumi ; et al. | 2010-08-12 |
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