Iwa; Yoichiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Iwa; Yoichiro.The latest application filed is for "apparatus for inspecting material property of plurality of measurement objects".
- Iwa; Yoichiro - Suwon-si KR
- Iwa; Yoichiro - Tokyo JP
- Iwa; Yoichiro - Itabashi-ku JP
- Iwa, Yoichiro - Tokyo-to JP
| Patent | Date |
|---|---|
| Apparatus for inspecting material property of plurality of measurement objects Grant 10,473,579 - Ahn , et al. Nov | 2019-11-12 |
| Apparatus For Inspecting Material Property Of Plurality Of Measurement Objects App 20190079003 - Ahn; Tae-Heung ; et al. | 2019-03-14 |
| Ophthalmologic apparatus Grant 7,566,129 - Hideshima , et al. July 28, 2 | 2009-07-28 |
| Ophthalmologic apparatus Grant 7,533,990 - Hideshima , et al. May 19, 2 | 2009-05-19 |
| Ophthalmologic apparatus Grant 7,524,062 - Iwa , et al. April 28, 2 | 2009-04-28 |
| Surface inspection method and surface inspection device Grant 7,477,373 - Miyakawa , et al. January 13, 2 | 2009-01-13 |
| Particle monitoring apparatus and vacuum processing apparatus Grant 7,417,732 - Iwa , et al. August 26, 2 | 2008-08-26 |
| Surface inspection method and apparatus Grant 7,394,532 - Isozaki , et al. July 1, 2 | 2008-07-01 |
| Ophthalmologic apparatus App 20080151189 - Iwa; Yoichiro ; et al. | 2008-06-26 |
| Surface inspection apparatus Grant 7,348,585 - Miyakawa , et al. March 25, 2 | 2008-03-25 |
| Ophthalmologic Apparatus App 20080002151 - Hideshima; Masayuki ; et al. | 2008-01-03 |
| Ophthalmologic Apparatus App 20070296919 - Hideshima; Masayuki ; et al. | 2007-12-27 |
| Surface inspection method and surface inspection device App 20070229813 - Miyakawa; Kazuhiro ; et al. | 2007-10-04 |
| Surface inspection method and surface inspection apparatus Grant 7,245,366 - Miyakawa , et al. July 17, 2 | 2007-07-17 |
| Surface inspection apparatus Grant 7,227,649 - Miyakawa , et al. June 5, 2 | 2007-06-05 |
| Method for inspecting surface and apparatus for inspecting it Grant 7,154,597 - Miyakawa , et al. December 26, 2 | 2006-12-26 |
| Particle monitoring apparatus and vacuum processing apparatus App 20060132769 - Iwa; Yoichiro ; et al. | 2006-06-22 |
| Surface inspection apparatus App 20060103856 - Miyakawa; Kazuhiro ; et al. | 2006-05-18 |
| Surface inspection apparatus App 20050270522 - Miyakawa, Kazuhiro ; et al. | 2005-12-08 |
| Method for inspecting surface and apparatus for inspecting it App 20040263835 - Miyakawa, Kazuhiro ; et al. | 2004-12-30 |
| Surface inspection method and surface inspection apparatus App 20040252295 - Miyakawa, Kazuhiro ; et al. | 2004-12-16 |
| Surface inspection apparatus App 20040169853 - Iwa, Yoichiro ; et al. | 2004-09-02 |
| Surface inspecting apparatus Grant 6,771,364 - Isozaki , et al. August 3, 2 | 2004-08-03 |
| Surface inspection method and apparatus App 20040130727 - Isozaki, Hisashi ; et al. | 2004-07-08 |
| Laser light source device and surface inspection apparatus using it App 20040095572 - Iwa, Yoichiro ; et al. | 2004-05-20 |
| Surface inspecting apparatus App 20040036865 - Isozaki, Hisashi ; et al. | 2004-02-26 |
| Surface inspection apparatus Grant 6,104,481 - Sekine , et al. August 15, 2 | 2000-08-15 |
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