Itzkovich; Tal

Patent Applications and Registrations

Patent applications and USPTO patent grants for Itzkovich; Tal.The latest application filed is for "process compatibility improvement by fill factor modulation".

Company Profile

4.8.8

Itzkovich; Tal - Kfar Uriya IL
Itzkovich; Tal - Kfar Yriya IL
Itzkovich; Tal - Kfar Uria N/A IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Process compatibility improvement by fill factor modulation Grant 10,579,768 - Levinski , et al.	2020-03-03
Compound imaging metrology targets Grant 10,527,951 - Yohanan , et al. J	2020-01-07
Method and apparatus for direct self assembly in target design and production Grant 10,303,835 - Amit , et al.	2019-05-28
Analyzing root causes of process variation in scatterometry metrology Grant 10,203,200 - Marciano , et al. Feb	2019-02-12
Process Compatibility Improvement by Fill Factor Modulation App 20180157784 - Levinski; Vladimir ; et al.	2018-06-07
Feed forward of metrology data in a metrology system Grant 9,903,711 - Levy , et al. February 27, 2	2018-02-27
Analyzing Root Causes of Process Variation in Scatterometry Metrology App 20180023950 - Marciano; Tal ; et al.	2018-01-25
Hybrid imaging and scatterometry targets Grant 9,476,838 - Choi , et al. October 25, 2	2016-10-25
Feed Forward of Metrology Data in a Metrology System App 20160290796 - Levy; Ady ; et al.	2016-10-06
Compound Imaging Metrology Targets App 20160179017 - YOHANAN; Raviv ; et al.	2016-06-23
Method And Apparatus For Direct Self Assembly In Target Design And Production App 20150242558 - AMIT; Eran ; et al.	2015-08-27
Device correlated metrology (DCM) for OVL with embedded SEM structure overlay targets Grant 9,093,458 - Amir , et al. July 28, 2	2015-07-28
Hybrid Imaging And Scatterometry Targets App 20140375984 - Choi; DongSub ; et al.	2014-12-25
Device Correlated Metrology (dcm) For Ovl With Embedded Sem Structure Overlay Targets App 20140065736 - Amir; Nuriel ; et al.	2014-03-06

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