Itoh; Toshihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Itoh; Toshihiro.The latest application filed is for "optical receiver".

Company Profile

3.20.17

Itoh; Toshihiro - Atsugi JP
Itoh; Toshihiro - Atsugi-shi Kanagawa-ken
Itoh; Toshihiro - Tokyo JP
Itoh; Toshihiro - Ibaraki JP
Itoh; Toshihiro - Shinshiro JP
ITOH; Toshihiro - Shinshiro-shi JP
Itoh; Toshihiro - Chiba JP
Itoh; Toshihiro - Chiba-shi Chiba 263-0022 JP
Itoh; Toshihiro - Shizuoka-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical receiver Grant 10,601,522 - Itoh , et al.	2020-03-24
Optical Receiver App 20190181961 - Itoh; Toshihiro ; et al.	2019-06-13
Optical modulator driver circuit and optical transmitter Grant 10,243,664 - Nagatani , et al.	2019-03-26
Sensor network system Grant 9,516,699 - Okada , et al. December 6, 2	2016-12-06
Optical Modulator Driver Circuit and Optical Transmitter App 20160087727 - Nagatani; Munehiko ; et al.	2016-03-24
Sensor Network System App 20150257203 - Okada; Hironao ; et al.	2015-09-10
DLC-coated fishing lure Grant 8,650,797 - Sugita , et al. February 18, 2	2014-02-18
Dlc-coated Fishing Lure App 20100212210 - SUGITA; Hiroaki ; et al.	2010-08-26
Semiconductor device and process for manufacturing the same Grant 7,776,735 - Suga , et al. August 17, 2	2010-08-17
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Grant 7,688,088 - Komatsu , et al. March 30, 2	2010-03-30
Semiconductor device and process for manufacturing the same App 20080254610 - SUGA; Tadatomo ; et al.	2008-10-16
Optical Transmission System App 20080226298 - Fukuyama; Hiroyuki ; et al.	2008-09-18
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object App 20080174325 - Komatsu; Shigekazu ; et al.	2008-07-24
Inspection apparatus to break the oxide of an electrode by fritting phenomenon Grant 7,319,339 - Iino , et al. January 15, 2	2008-01-15
Inspection method and inspection apparatus Grant 7,304,489 - Iino , et al. December 4, 2	2007-12-04
High-reliable semiconductor device using hermetic sealing of electrodes Grant 7,301,243 - Suga , et al. November 27, 2	2007-11-27
Inspection Method And Inspection Apparatus App 20070229101 - Iino; Shinji ; et al.	2007-10-04
Semiconductor device and process for manufacturing the same Grant 7,268,430 - Suga , et al. September 11, 2	2007-09-11
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object Grant 7,262,613 - Komatsu , et al. August 28, 2	2007-08-28
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object App 20070063725 - Komatsu; Shigekazu ; et al.	2007-03-22
Method of mounting an electronic part Grant 7,100,279 - Suga , et al. September 5, 2	2006-09-05
Inspection method and inspection apparatus App 20060192578 - Iino; Shinji ; et al.	2006-08-31
Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object App 20060145716 - Komatsu; Shigekazu ; et al.	2006-07-06
Inspection method and inspection apparatus Grant 7,061,259 - Iino , et al. June 13, 2	2006-06-13
High-reliable semiconductor device using hermetic sealing of electrodes App 20060043604 - Suga; Tadatomo ; et al.	2006-03-02
Semiconductor device and process for manufacturing the same App 20060043552 - Suga; Tadatomo ; et al.	2006-03-02
Player information-providing method, server, program for controlling the server, and storage medium storing the program Grant 6,936,758 - Itoh August 30, 2	2005-08-30
Method of mounting an electronic part App 20040211060 - Suga, Tadatomo ; et al.	2004-10-28
Inspection method and inspection apparatus App 20040174177 - Iino, Shinji ; et al.	2004-09-09
Inspection method and inspection apparatus Grant 6,777,967 - Iino , et al. August 17, 2	2004-08-17
Player information-providing method, server, program for controlling the server, and storage medium storing the program App 20030167904 - Itoh, Toshihiro	2003-09-11
Inspection method and inspection apparatus App 20020021142 - Iino, Shinji ; et al.	2002-02-21

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