Itagaki; Yousuke

Patent Applications and Registrations

Patent applications and USPTO patent grants for Itagaki; Yousuke.The latest application filed is for "object-processing apparatus controlling production of particles in electric field or magnetic field".

Company Profile

0.13.12

Itagaki; Yousuke - Kawasaki JP
Itagaki; Yousuke - Kanagawa JP
Itagaki; Yousuke - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Object-processing apparatus controlling production of particles in electric field or magnetic field Grant 8,051,799 - Itagaki , et al. November 8, 2	2011-11-08
Plasma processing apparatus and method of suppressing abnormal discharge therein Grant 7,974,067 - Ito , et al. July 5, 2	2011-07-05
Semiconductor device tester Grant 7,385,195 - Yamada , et al. June 10, 2	2008-06-10
Object-processing Apparatus Controlling Production Of Particles In Electric Field Or Magnetic Field App 20080041306 - ITAGAKI; Yousuke ; et al.	2008-02-21
Production managing system of semiconductor device Grant 7,321,805 - Yamada , et al. January 22, 2	2008-01-22
Plasma processing apparatus and method of suppressing abnormal discharge therein App 20070058322 - Ito; Natsuko ; et al.	2007-03-15
Semiconductor device tester App 20060202119 - Yamada; Keizo ; et al.	2006-09-14
Film thickness measuring apparatus and a method for measuring a thickness of a film Grant 7,002,361 - Yamada , et al. February 21, 2	2006-02-21
Semiconductor device tester Grant 6,975,125 - Yamada , et al. December 13, 2	2005-12-13
Semiconductor device tester Grant 6,946,857 - Yamada , et al. September 20, 2	2005-09-20
Film Thickness Measuring Apparatus And A Method For Measuring A Thickness Of A Film App 20050116726 - Yamada, Keizo ; et al.	2005-06-02
Production managing system of semiconductor device App 20050106803 - Yamada, Keizo ; et al.	2005-05-19
Film thickness measuring apparatus and a method for measuring a thickness of a film Grant 6,850,079 - Yamada , et al. February 1, 2	2005-02-01
Production managing system of semiconductor device Grant 6,842,663 - Yamada , et al. January 11, 2	2005-01-11
Semiconductor manufacturing device Grant 6,837,936 - Ushiki , et al. January 4, 2	2005-01-04
Semiconductor device tester App 20040239347 - Yamada, Keizo ; et al.	2004-12-02
Semiconductor device tester App 20040207415 - Yamada, Keizo ; et al.	2004-10-21
Production managing system of semiconductor device App 20040167656 - Yamada, Keizo ; et al.	2004-08-26
Semiconductor device tester which measures information related to a structure of a sample in a depth direction Grant 6,768,324 - Yamada , et al. July 27, 2	2004-07-27
Production managing system of semiconductor device Grant 6,711,453 - Yamada , et al. March 23, 2	2004-03-23
Semiconductor device inspecting apparatus Grant 6,614,244 - Yamada , et al. September 2, 2	2003-09-02
Film thickness measuring apparatus and a method for measuring a thickness of a film App 20030132765 - Yamada, Keizo ; et al.	2003-07-17
Production managing system of semiconductor device App 20020123818 - Yamada, Keizo ; et al.	2002-09-05
Semiconductor manufacturing device App 20020118348 - Ushiki, Takeo ; et al.	2002-08-29
Semiconductor device inspecting apparatus App 20020070738 - Yamada, Keizo ; et al.	2002-06-13

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