Isozaki; Hisashi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Isozaki; Hisashi.The latest application filed is for "temperature measurement device and temperature measurement method".
Company Profile
1.26.25
- Isozaki; Hisashi - Tokyo JP
- Isozaki; Hisashi - Tokyo-to JP
- Isozaki; Hisashi - Itabashi-ku JP
- Isozaki; Hisashi - Hasuda JP
- Isozaki; Hisashi - Hasuda-shi JP
Patent Activity
| Patent | Date |
|---|---|
| Temperature measurement device and temperature measurement method Grant 10,502,630 - Isozaki Dec | 2019-12-10 |
| Illuminance measuring system Grant 10,067,233 - Isozaki , et al. September 4, 2 | 2018-09-04 |
| Management system for illumination facility Grant 9,952,091 - Isozaki April 24, 2 | 2018-04-24 |
| Temperature Measurement Device And Temperature Measurement Method App 20180087968 - ISOZAKI; Hisashi | 2018-03-29 |
| Illuminance Measuring System App 20180045829 - Isozaki; Hisashi ; et al. | 2018-02-15 |
| Illuminance measuring system Grant 9,823,354 - Isozaki , et al. November 21, 2 | 2017-11-21 |
| Spatial light measuring method and spatial light measuring system Grant 9,719,850 - Isozaki , et al. August 1, 2 | 2017-08-01 |
| Spatial Light Measuring Method And Spatial Light Measuring System App 20170023403 - Isozaki; Hisashi ; et al. | 2017-01-26 |
| Illuminance Measuring System App 20170023351 - Isozaki; Hisashi ; et al. | 2017-01-26 |
| Management System For Illumination Facility App 20170023404 - Isozaki; Hisashi | 2017-01-26 |
| Electron microscope device Grant 8,791,415 - Isozaki July 29, 2 | 2014-07-29 |
| Electron microscope device Grant 8,692,194 - Isozaki , et al. April 8, 2 | 2014-04-08 |
| Complex type microscopic device Grant 8,351,115 - Isozaki , et al. January 8, 2 | 2013-01-08 |
| Measuring apparatus Grant 8,243,264 - Isozaki , et al. August 14, 2 | 2012-08-14 |
| Interference Microscope And Measuring Apparatus App 20120120485 - Ootomo; Fumio ; et al. | 2012-05-17 |
| Electron microscope device Grant 8,097,849 - Ohtomo , et al. January 17, 2 | 2012-01-17 |
| Electron Microscope Device App 20110315877 - Isozaki; Hisashi ; et al. | 2011-12-29 |
| Surface inspecting method and device Grant 8,009,286 - Isozaki , et al. August 30, 2 | 2011-08-30 |
| Measuring Apparatus App 20110043808 - ISOZAKI; Hisashi ; et al. | 2011-02-24 |
| Measuring Apparatus App 20110043825 - ISOZAKI; Hisashi ; et al. | 2011-02-24 |
| Electron microscope device App 20100163728 - Ohtomo; Fumio ; et al. | 2010-07-01 |
| Electron microscope device App 20100163729 - Isozaki; Hisashi | 2010-07-01 |
| Complex type microscopic device App 20100091362 - Isozaki; Hisashi ; et al. | 2010-04-15 |
| Surface Inspecting Method And Device App 20100007872 - Isozaki; Hisashi ; et al. | 2010-01-14 |
| Surface inspection method and apparatus Grant 7,394,532 - Isozaki , et al. July 1, 2 | 2008-07-01 |
| Particle detecting method and storage medium storing program for implementing the method Grant 7,352,461 - Saito , et al. April 1, 2 | 2008-04-01 |
| Method and device for surface inspection Grant 7,245,388 - Isozaki , et al. July 17, 2 | 2007-07-17 |
| Particle detecting method and storage medium storing program for implementing the method App 20060132771 - Saito; Susumu ; et al. | 2006-06-22 |
| Surface inspection method and surface inspection system Grant 7,064,820 - Isozaki , et al. June 20, 2 | 2006-06-20 |
| Surface inspection system Grant 7,046,353 - Isozaki , et al. May 16, 2 | 2006-05-16 |
| Surface inspection system Grant 6,941,792 - Isozaki , et al. September 13, 2 | 2005-09-13 |
| Surface inspecting apparatus and method Grant 6,847,444 - Isozaki , et al. January 25, 2 | 2005-01-25 |
| Surface inspecting apparatus Grant 6,771,364 - Isozaki , et al. August 3, 2 | 2004-08-03 |
| Surface inspection method and apparatus App 20040130727 - Isozaki, Hisashi ; et al. | 2004-07-08 |
| Method and device for surface inspection App 20040119971 - Isozaki, Hisashi ; et al. | 2004-06-24 |
| Laser light source device and surface inspection apparatus using it App 20040095572 - Iwa, Yoichiro ; et al. | 2004-05-20 |
| Surface inspecting apparatus and method App 20040061851 - Isozaki, Hisashi ; et al. | 2004-04-01 |
| Surface inspecting apparatus App 20040036865 - Isozaki, Hisashi ; et al. | 2004-02-26 |
| Surface inspection apparatus and method Grant 6,654,111 - Isozaki , et al. November 25, 2 | 2003-11-25 |
| Surface inspection method and surface inspection system App 20030184744 - Isozaki, Hisashi ; et al. | 2003-10-02 |
| Surface inspecting apparatus and method Grant 6,611,328 - Isozaki , et al. August 26, 2 | 2003-08-26 |
| Surface inspection system App 20030103203 - Isozaki, Hisashi ; et al. | 2003-06-05 |
| Surface inspection system App 20030029220 - Isozaki, Hisashi ; et al. | 2003-02-13 |
| Surface inspecting apparatus and method App 20020021438 - Isozaki, Hisashi ; et al. | 2002-02-21 |
| Surface inspecting apparatus and method App 20020005945 - Isozaki, Hisashi ; et al. | 2002-01-17 |
| Surface inspection apparatus and method App 20010035951 - Isozaki, Hisashi ; et al. | 2001-11-01 |
| Apparatus for surface inspection Grant 6,204,918 - Isozaki , et al. March 20, 2 | 2001-03-20 |
| Method and apparatus for surface inspection Grant 6,115,117 - Isozaki September 5, 2 | 2000-09-05 |
| Surface inspection apparatus Grant 6,104,481 - Sekine , et al. August 15, 2 | 2000-08-15 |
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