ISOGAI; Seiji

Patent Applications and Registrations

Patent applications and USPTO patent grants for ISOGAI; Seiji.The latest application filed is for "defect determining method and x-ray inspection device".

Company Profile

0.19.15

ISOGAI; Seiji - Tokyo JP
Isogai; Seiji - Hitachinaka N/A JP
Isogai; Seiji - Hitachinaka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect Determining Method and X-Ray Inspection Device App 20180209924 - SASAZAWA; Hideaki ; et al.	2018-07-26
Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method Grant 8,995,748 - Sakai , et al. March 31, 2	2015-03-31
Inspecting method, inspecting system, and method for manufacturing electronic devices Grant 8,428,336 - Ikeda , et al. April 23, 2	2013-04-23
Defect Image Processing Apparatus, Defect Image Processing Method, Semiconductor Defect Classifying Apparatus, And Semiconductor Defect Classifying Method App 20120141011 - Sakai; Tsunehiro ; et al.	2012-06-07
Method for inspecting defect and system therefor Grant 7,558,683 - Ninomiya , et al. July 7, 2	2009-07-07
Defect Image Classifying Method and Apparatus and a Semiconductor Device Manufacturing Process Based on the Method and Apparatus App 20080187212 - OBARA; Kenji ; et al.	2008-08-07
Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus Grant 7,356,177 - Obara , et al. April 8, 2	2008-04-08
Method for analyzing circuit pattern defects and a system thereof Grant 7,352,890 - Shimoda , et al. April 1, 2	2008-04-01
Method for inspecting defect and system therefor App 20080059083 - Ninomiya; Takanori ; et al.	2008-03-06
Scanning electron microscope Grant 7,307,254 - Yamaguchi , et al. December 11, 2	2007-12-11
Scanning electron microscope Grant 7,307,253 - Yamaguchi , et al. December 11, 2	2007-12-11
Method for inspecting defect and system therefor Grant 7,305,314 - Ninomiya , et al. December 4, 2	2007-12-04
Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus App 20060274933 - Obara; Kenji ; et al.	2006-12-07
Inspecting method, inspecting system, and method for manufacturing electronic devices App 20060274932 - Ikeda; Yoko ; et al.	2006-12-07
Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus Grant 7,113,628 - Obara , et al. September 26, 2	2006-09-26
Method for analyzing circuit pattern defects and a system thereof App 20060140472 - Shimoda; Atsushi ; et al.	2006-06-29
Inspecting method, inspecting system, and method for manufacturing electronic devices Grant 7,068,834 - Ikeda , et al. June 27, 2	2006-06-27
Method and system for analyzing circuit pattern defects Grant 7,062,081 - Shimoda , et al. June 13, 2	2006-06-13
Method for inspecting defect and system therefor App 20060100804 - Ninomiya; Takanori ; et al.	2006-05-11
Method for inspecting defect and system therefor Grant 7,010,447 - Ninomiya , et al. March 7, 2	2006-03-07
Scanning electron microscope App 20060043294 - Yamaguchi; Kohei ; et al.	2006-03-02
Review work supporting system Grant 6,978,041 - Isogai , et al. December 20, 2	2005-12-20
Scanning electron microscope App 20050236569 - Yamaguchi, Kohei ; et al.	2005-10-27
Method for inspecting defect and system therefor App 20040260496 - Ninomiya, Takanori ; et al.	2004-12-23
Method for inspecting defect and system therefor Grant 6,792,359 - Ninomiya , et al. September 14, 2	2004-09-14
Method for observing specimen and device therefor Grant 6,756,589 - Obara , et al. June 29, 2	2004-06-29
Process management system Grant 6,757,621 - Mizuno , et al. June 29, 2	2004-06-29
Process management system App 20030130806 - Mizuno, Fumio ; et al.	2003-07-10
Process control system Grant 6,542,830 - Mizuno , et al. April 1, 2	2003-04-01
Review work supporting system App 20020196968 - Isogai, Seiji ; et al.	2002-12-26
Method for inspecting defect and system therefor App 20020035435 - Ninomiya, Takanori ; et al.	2002-03-21
Method for analyzing circuit pattern defects and a system thereof App 20010016061 - Shimoda, Atsushi ; et al.	2001-08-23

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.