Isogai; Hiromichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Isogai; Hiromichi.The latest application filed is for "quartz glass part and fabrication method for quartz glass part".
- Isogai; Hiromichi - Yamagata-shi Yamagata
- Isogai; Hiromichi - Niigata N/A JP
- Isogai; Hiromichi - Kitakanbara-gun JP
- Isogai; Hiromichi - Shibata JP
- Isogai, Hiromichi - Shibata-shi JP
| Patent | Date |
|---|---|
| Quartz Glass Part and Fabrication Method for Quartz Glass Part App 20160244358 - Isogai; Hiromichi ; et al. | 2016-08-25 |
| Silicon wafer and method for heat-treating silicon wafer Grant 8,999,864 - Senda , et al. April 7, 2 | 2015-04-07 |
| Single crystal pulling-up apparatus of pulling-up silicon single crystal and single crystal pulling-up method of pulling-up silicon single crystal Grant 8,936,679 - Banba , et al. January 20, 2 | 2015-01-20 |
| Method of manufacturing single crystal silicon wafer from ingot grown by Czocharlski process with rapid heating/cooling process Grant 8,476,149 - Isogai , et al. July 2, 2 | 2013-07-02 |
| Method for heat treating a silicon wafer Grant 8,399,341 - Senda , et al. March 19, 2 | 2013-03-19 |
| Method of heat treating silicon wafer Grant 8,252,700 - Senda , et al. August 28, 2 | 2012-08-28 |
| Method For Heat Treating A Silicon Wafer App 20120184091 - Senda; Takeshi ; et al. | 2012-07-19 |
| Silicon Wafer And Method For Heat-treating Silicon Wafer App 20120139088 - Senda; Takeshi ; et al. | 2012-06-07 |
| Single crystal pulling-up apparatus and single crystal pulling-up method App 20120067272 - Banba; Hironori ; et al. | 2012-03-22 |
| Manufacturing method for silicon wafer Grant 7,977,219 - Isogai , et al. July 12, 2 | 2011-07-12 |
| Method of heat treating silicon wafer App 20100197146 - Senda; Takeshi ; et al. | 2010-08-05 |
| Manufacturing Method For Silicon Wafer App 20100055884 - Isogai; Hiromichi ; et al. | 2010-03-04 |
| Silicon Wafer, Method For Manufacturing The Same And Method For Heat-treating The Same App 20100038757 - Isogai; Hiromichi ; et al. | 2010-02-18 |
| Method Of Manufacturing Semiconductor Substrate App 20090004825 - SENDA; Takeshi ; et al. | 2009-01-01 |
| Semiconductor Substrate And Manufacturing Method Thereof App 20080164572 - Toyoda; Eiji ; et al. | 2008-07-10 |
| Wafer inspection apparatus Grant 7,149,341 - Hayashi , et al. December 12, 2 | 2006-12-12 |
| Polishing head and polishing apparatus Grant 6,976,908 - Masunaga , et al. December 20, 2 | 2005-12-20 |
| Polishing head and polishing apparatus App 20050124269 - Masunaga, Takayuki ; et al. | 2005-06-09 |
| Viscoelasticity measuring device Grant 6,668,662 - Isogai , et al. December 30, 2 | 2003-12-30 |
| Wafer inspection apparatus App 20030169916 - Hayashi, Yoshinori ; et al. | 2003-09-11 |
| Viscoelasticity measuring device App 20020178795 - Isogai, Hiromichi ; et al. | 2002-12-05 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 