Ishitani; Tohru
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ishitani; Tohru.The latest application filed is for "gas field ionization ion source and ion beam device".
Company Profile
0.66.41
- Ishitani; Tohru - Sayama JP
- Ishitani; Tohru - Hitachinaka JP
- Ishitani; Tohru - Hitachinaka-shi JP
- Ishitani; Tohru - Katsuta JP
- Ishitani, Tohru - Katsuta-shi JP
- ISHITANI, TOHRU - SAYAMA-SHI JP
- Ishitani; Tohru - Sayamashi JP
Patent Activity
| Patent | Date |
|---|---|
| Gas field ionization ion source and ion beam device Grant 9,196,453 - Kawanami , et al. November 24, 2 | 2015-11-24 |
| Gas Field Ionization Ion Source And Ion Beam Device App 20140326897 - KAWANAMI; Yoshimi ; et al. | 2014-11-06 |
| Gas field ionization ion source and ion beam device Grant 8,809,801 - Kawanami , et al. August 19, 2 | 2014-08-19 |
| Method and apparatus for specimen fabrication Grant 8,796,651 - Shichi , et al. August 5, 2 | 2014-08-05 |
| Ion beam device Grant 8,563,944 - Shichi , et al. October 22, 2 | 2013-10-22 |
| Gas field ion source, charged particle microscope, and apparatus Grant 8,530,865 - Shichi , et al. September 10, 2 | 2013-09-10 |
| Gas Field Ionization Ion Source, Scanning Charged Particle Microscope, Optical Axis Adjustment Method And Specimen Observation Method App 20130087704 - ISHITANI; Tohru ; et al. | 2013-04-11 |
| Ion Beam Device App 20120319003 - SHICHI; Hiroyasu ; et al. | 2012-12-20 |
| Ion beam device Grant 8,263,943 - Shichi , et al. September 11, 2 | 2012-09-11 |
| Charged Particle Microscope App 20120217391 - Shichi; Hiroyasu ; et al. | 2012-08-30 |
| Gas Field Ionization Ion Source And Ion Beam Device App 20120199758 - Kawanami; Yoshimi ; et al. | 2012-08-09 |
| Gas Field Ionization Ion Source Apparatus And Scanning Charged Particle Microscope Equipped With Same App 20120132802 - Arai; Noriaki ; et al. | 2012-05-31 |
| Gas Field Ion Source, Charged Particle Microscope, And Apparatus App 20120119086 - Shichi; Hiroyasu ; et al. | 2012-05-17 |
| Gas field ion source, charged particle microscope, and apparatus Grant 8,115,184 - Shichi , et al. February 14, 2 | 2012-02-14 |
| Ion Beam Device App 20110266465 - Shichi; Hiroyasu ; et al. | 2011-11-03 |
| Scanning Charged Particle Microscope App 20110254944 - Ishitani; Tohru ; et al. | 2011-10-20 |
| Charged particle beam orbit corrector and charged particle beam apparatus Grant 7,947,964 - Ito , et al. May 24, 2 | 2011-05-24 |
| Method and apparatus for specimen fabrication App 20110114476 - Shichi; Hiroyasu ; et al. | 2011-05-19 |
| Charged particle beam apparatus and sample manufacturing method Grant 7,928,377 - Ishitani , et al. April 19, 2 | 2011-04-19 |
| Methods for sample preparation and observation, charged particle apparatus Grant 7,915,581 - Ishitani , et al. March 29, 2 | 2011-03-29 |
| Method and apparatus for specimen fabrication Grant 7,897,936 - Shichi , et al. March 1, 2 | 2011-03-01 |
| Liquid metal ion gun Grant 7,804,073 - Kaga , et al. September 28, 2 | 2010-09-28 |
| Image evaluation method and microscope Grant 7,805,023 - Ishitani , et al. September 28, 2 | 2010-09-28 |
| Gas field ion source, charged particle microscope, and apparatus App 20090173888 - SHICHI; Hiroyasu ; et al. | 2009-07-09 |
| Focused ION beam apparatus Grant 7,550,740 - Takeuchi , et al. June 23, 2 | 2009-06-23 |
| Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation method App 20090152462 - Ishitani; Tohru ; et al. | 2009-06-18 |
| Methods for Sample Preparation and Observation, Charged Particle Apparatus App 20090127458 - ISHITANI; Tohru ; et al. | 2009-05-21 |
| Methods for sample preparation and observation, charged particle apparatus Grant 7,482,586 - Ishitani , et al. January 27, 2 | 2009-01-27 |
| Liquid metal ion gun App 20080210883 - Kaga; Hiroyasu ; et al. | 2008-09-04 |
| Liquid metal ion gun Grant 7,420,181 - Kaga , et al. September 2, 2 | 2008-09-02 |
| Method and apparatus for specimen fabrication App 20080191151 - Shichi; Hiroyasu ; et al. | 2008-08-14 |
| Focused ion beam apparatus and focused ion beam irradiation method Grant 7,411,192 - Takeuchi , et al. August 12, 2 | 2008-08-12 |
| Charged Particle Beam Orbit Corrector and Charged Particle Beam Apparatus App 20080116391 - Ito; Hiroyuki ; et al. | 2008-05-22 |
| Image evaluation method and microscope Grant 7,340,111 - Ishitani , et al. March 4, 2 | 2008-03-04 |
| Focused ION Beam Apparatus App 20080023641 - TAKEUCHI; Koichiro ; et al. | 2008-01-31 |
| Image evaluation method and microscope App 20070280559 - Ishitani; Tohru ; et al. | 2007-12-06 |
| Probe driving method, and probe apparatus Grant 7,301,146 - Tomimatsu , et al. November 27, 2 | 2007-11-27 |
| Liquid metal ion gun App 20070257200 - Kaga; Hiroyasu ; et al. | 2007-11-08 |
| Method and apparatus for specimen fabrication Grant 7,268,356 - Shichi , et al. September 11, 2 | 2007-09-11 |
| Focused ion beam apparatus Grant 7,235,798 - Ishitani , et al. June 26, 2 | 2007-06-26 |
| Image evaluation method and microscope Grant 7,236,651 - Ishitani , et al. June 26, 2 | 2007-06-26 |
| Liquid metal ion gun Grant 7,211,805 - Kaga , et al. May 1, 2 | 2007-05-01 |
| Scanning charged-particle microscope Grant 7,186,975 - Ishitani , et al. March 6, 2 | 2007-03-06 |
| Methods for sample preparation and observation, charged particle apparatus App 20070023651 - Ishitani; Tohru ; et al. | 2007-02-01 |
| Ion beam apparatus and sample processing method Grant 7,084,399 - Muto , et al. August 1, 2 | 2006-08-01 |
| Charged particle beam apparatus and sample manufacturing method App 20060097166 - Ishitani; Tohru ; et al. | 2006-05-11 |
| Liquid metal ion gun App 20060097186 - Kaga; Hiroyasu ; et al. | 2006-05-11 |
| Liquid metal ion gun Grant 7,005,651 - Kaga , et al. February 28, 2 | 2006-02-28 |
| Focused ion beam apparatus and focused ion beam irradiation method App 20060022150 - Takeuchi; Koichiro ; et al. | 2006-02-02 |
| Focused ion beam apparatus App 20050279952 - Ishitani, Tohru ; et al. | 2005-12-22 |
| Probe driving method, and probe apparatus App 20050269511 - Tomimatsu, Satoshi ; et al. | 2005-12-08 |
| Apparatus for inspecting defects of devices and method of inspecting defects Grant 6,970,004 - Ishitani , et al. November 29, 2 | 2005-11-29 |
| Probe driving method, and probe apparatus Grant 6,960,765 - Tomimatsu , et al. November 1, 2 | 2005-11-01 |
| Image evaluation method and microscope App 20050199811 - Ishitani, Tohru ; et al. | 2005-09-15 |
| Liquid metal ion gun App 20050127304 - Kaga, Hiroyasu ; et al. | 2005-06-16 |
| Ion beam apparatus and sample processing method App 20050092922 - Muto, Hiroyuki ; et al. | 2005-05-05 |
| Method and apparatus for specimen fabrication App 20050006600 - Shichi, Hiroyasu ; et al. | 2005-01-13 |
| Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write element Grant 6,839,200 - Takano , et al. January 4, 2 | 2005-01-04 |
| Ion beam apparatus and sample processing method Grant 6,822,245 - Muto , et al. November 23, 2 | 2004-11-23 |
| Method and apparatus for specimen fabrication Grant 6,794,663 - Shichi , et al. September 21, 2 | 2004-09-21 |
| Apparatus for inspecting defects of devices and method of inspecting defects App 20040178811 - Ishitani, Tohru ; et al. | 2004-09-16 |
| Method and apparatus for specimen fabrication App 20040089821 - Shichi, Hiroyasu ; et al. | 2004-05-13 |
| Apparatus for detecting defect in device and method of detecting defect Grant 6,734,687 - Ishitani , et al. May 11, 2 | 2004-05-11 |
| Narrow track thin film magnetic head and fabrication method thereof App 20040080865 - Takano, Hisashi ; et al. | 2004-04-29 |
| Magnetic head having track width defined by trench portions filled with magnetic shield material Grant 6,665,141 - Takano , et al. December 16, 2 | 2003-12-16 |
| Method and apparatus for specimen fabrication Grant 6,664,552 - Shichi , et al. December 16, 2 | 2003-12-16 |
| Probe driving method, and probe apparatus App 20030184332 - Tomimatsu, Satoshi ; et al. | 2003-10-02 |
| Apparatus and method for observing sample using electron beam Grant 6,627,889 - Ochiai , et al. September 30, 2 | 2003-09-30 |
| Narrow track thin film magnetic head and fabrication method thereof App 20030099063 - Takano, Hisashi ; et al. | 2003-05-29 |
| Apparatus and method for observing sample using electron beam App 20030089852 - Ochiai, Isao ; et al. | 2003-05-15 |
| Image evaluation method and microscope App 20030039386 - Ishitani, Tohru ; et al. | 2003-02-27 |
| Focused ion beam machining method and focused ion beam machining apparatus Grant 6,521,890 - Ishitani , et al. February 18, 2 | 2003-02-18 |
| Focused Ion Beam Machining Method And Focused Ion Beam Machining Apparatus App 20020092985 - ISHITANI, TOHRU ; et al. | 2002-07-18 |
| Narrow track thin film magnetic head and fabrication method thereof App 20020080521 - Takano, Hisashi ; et al. | 2002-06-27 |
| Method and apparatus for specimen fabrication App 20020079463 - Shichi, Hiroyasu ; et al. | 2002-06-27 |
| Scanning charged-particle microscope App 20020079448 - Ishitani, Tohru ; et al. | 2002-06-27 |
| Ion beam apparatus and sample processing method App 20020008208 - Muto, Hiroyuki ; et al. | 2002-01-24 |
| Projecting type charged particle microscope and projecting type substrate inspection system Grant 6,310,341 - Todokoro , et al. October 30, 2 | 2001-10-30 |
| Narrow track thin film head having a focused ion beam etched air bearing surface Grant 6,278,578 - Takano , et al. August 21, 2 | 2001-08-21 |
| Focused ion beam apparatus and method for irradiating focused ion beam Grant 5,852,297 - Ishitani , et al. December 22, 1 | 1998-12-22 |
| Method for making specimen and apparatus thereof Grant 5,656,811 - Itoh , et al. August 12, 1 | 1997-08-12 |
| Liquid metal ion source with high temperature cleaning apparatus for cleaning the emitter and reservoir Grant 5,399,865 - Umemura , et al. March 21, 1 | 1995-03-21 |
| Method for separating specimen and method for analyzing the specimen separated by the specimen separating method Grant 5,270,552 - Ohnishi , et al. December 14, 1 | 1993-12-14 |
| Method of microarea analysis with a focused cesium ion beam Grant 5,148,027 - Umemura , et al. September 15, 1 | 1992-09-15 |
| Methods for device transplantation Grant 5,120,925 - Ohnishi , et al. June 9, 1 | 1992-06-09 |
| Device having superlattice structure, and method of and apparatus for manufacturing the same Grant 5,113,072 - Yamaguchi , et al. May 12, 1 | 1992-05-12 |
| Charged particle beam apparatus Grant 5,065,034 - Kawanami , et al. November 12, 1 | 1991-11-12 |
| Method of manufacturing devices having superlattice structures Grant 4,983,540 - Yamaguchi , et al. January 8, 1 | 1991-01-08 |
| Specimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting method Grant 4,939,364 - Ishitani , et al. July 3, 1 | 1990-07-03 |
| Ion-beam machining method and apparatus Grant 4,936,968 - Ohnishi , et al. June 26, 1 | 1990-06-26 |
| Liquid metal ion source Grant 4,774,414 - Umemura , et al. September 27, 1 | 1988-09-27 |
| Ion micro beam apparatus Grant 4,755,685 - Kawanami , et al. July 5, 1 | 1988-07-05 |
| Liquid metal ion source with pulse generator control Grant 4,733,134 - Tamura , et al. March 22, 1 | 1988-03-22 |
| Ion microbeam apparatus Grant 4,710,632 - Ishitani , et al. December 1, 1 | 1987-12-01 |
| Apparatus for implanting ion microbeam Grant 4,697,086 - Ishitani , et al. September 29, 1 | 1987-09-29 |
| Liquid metal ion source Grant 4,680,507 - Uemura , et al. July 14, 1 | 1987-07-14 |
| Liquid metal ion source and apparatus Grant 4,624,833 - Umemura , et al. November 25, 1 | 1986-11-25 |
| Liquid metal ion source Grant 4,567,398 - Ishitani , et al. January 28, 1 | 1986-01-28 |
| Ion source Grant 4,560,907 - Tamura , et al. December 24, 1 | 1985-12-24 |
| Apparatus for irradiation with charged particle beams Grant 4,479,060 - Tamura , et al. October 23, 1 | 1984-10-23 |
| Source of charged particles beam Grant 4,438,371 - Hosoki , et al. March 20, 1 | 1984-03-20 |
| Ion-electron analyzer Grant 4,233,509 - Tamura , et al. November 11, 1 | 1980-11-11 |
| Ion microprobe analyzer Grant 4,081,674 - Tamura , et al. March 28, 1 | 1978-03-28 |
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