Ishioka; Shogo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ishioka; Shogo.The latest application filed is for "conductor inspection apparatus and conductor inspection method".

Company Profile

0.17.22

Ishioka; Shogo - Hiroshima JP
Ishioka; Shogo - Fukayasu-gun JP
Ishioka, Shogo - Fukayasu-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Conductor inspection apparatus and conductor inspection method Grant 7,332,914 - Yamaoka , et al. February 19, 2	2008-02-19
Sensor for inspection instrument and inspection instrument Grant 7,173,445 - Fujii , et al. February 6, 2	2007-02-06
Device and method for inspection Grant 7,138,805 - Ishioka , et al. November 21, 2	2006-11-21
Conductor inspection apparatus and conductor inspection method App 20060226851 - Yamaoka; Shuji ; et al.	2006-10-12
Circuit pattern inspection instrument and pattern inspection method Grant 7,088,107 - Yamaoka , et al. August 8, 2	2006-08-08
Inspection device and inspection method Grant 7,049,826 - Okano , et al. May 23, 2	2006-05-23
Circuit pattern inspection instrument and pattern inspection method App 20060055413 - Yamaoka; Shuji ; et al.	2006-03-16
Circuit pattern inspection device and circuit pattern inspection method App 20060043153 - Yamaoka; Shuji ; et al.	2006-03-02
Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium Grant 6,995,566 - Yamaoka , et al. February 7, 2	2006-02-07
Device and method for substrate displacement detection Grant 6,992,493 - Yamaoka , et al. January 31, 2	2006-01-31
Device and method for inspecting circuit board Grant 6,972,573 - Ishioka , et al. December 6, 2	2005-12-06
Inspecting apparatus and inspecting method for circuit board Grant 6,958,619 - Yamaoka , et al. October 25, 2	2005-10-25
Inspection method and apparatus for testing fine pitch traces Grant 6,952,104 - Yamaoka , et al. October 4, 2	2005-10-04
Circuit pattern inspection device, circuit pattern inspection method, and recording medium Grant 6,943,559 - Yamaoka , et al. September 13, 2	2005-09-13
Inspection unit and method of manufacturing substrate Grant 6,894,515 - Okano , et al. May 17, 2	2005-05-17
Inspection apparatus for conductive patterns of a circuit board, and a holder thereof Grant 6,861,863 - Ishioka , et al. March 1, 2	2005-03-01
Apparatus and method for inspecting a board used in a liquid crystal panel Grant 6,859,062 - Fujii , et al. February 22, 2	2005-02-22
Information providing system, information providing method, information providing device, and recording medium App 20050010480 - Ishioka, Shogo ; et al.	2005-01-13
Inspecting apparatus and inspecting method for circuit board Grant 6,842,026 - Yamaoka , et al. January 11, 2	2005-01-11
Tester and testing method App 20040243345 - Fujii, Tatsuhisa ; et al.	2004-12-02
Sensor for inspection instrument and inspection instrument App 20040241887 - Fujii, Tatsuhisa ; et al.	2004-12-02
Tester and testing method App 20040240724 - Fujii, Tatsuhisa ; et al.	2004-12-02
Circuit wiring inspetion instrument and circuit wiring inspecting method App 20040234121 - Fujii, Tatsuhisa ; et al.	2004-11-25
Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium App 20040150409 - Yamaoka, Shuji ; et al.	2004-08-05
Device and method for substrate displacement detection App 20040153282 - Yamaoka, Shuji ; et al.	2004-08-05
Inspection apparatus and inspection method App 20040095144 - Yamaoka, Shuji ; et al.	2004-05-20
Inspection apparatus and sensor Grant 6,734,692 - Fujii , et al. May 11, 2	2004-05-11
Method and apparatus for inspection Grant 6,710,607 - Fujii , et al. March 23, 2	2004-03-23
Inspection apparatus and inspection method App 20030117164 - Fujii, Tatuhisa ; et al.	2003-06-26
Inspecting apparatus and inspecting method for circuit board App 20030001562 - Yamaoka, Shuji ; et al.	2003-01-02
Inspecting apparatus and inspecting method for circuit board App 20030001561 - Yamaoka, Shuji ; et al.	2003-01-02
Inspection device and inspection method App 20020180455 - Okano, Koji ; et al.	2002-12-05
Inspection unit and method of manufacturing substrate App 20020180454 - Okano, Koji ; et al.	2002-12-05
Device and method for inspecting circuit board App 20020163341 - Ishioka, Shogo ; et al.	2002-11-07
Device and method for inspection App 20020163342 - Ishioka, Shogo ; et al.	2002-11-07
Tester and holder for tester App 20020140445 - Ishioka, Shogo ; et al.	2002-10-03
Inspection apparatus and sensor App 20020140448 - Fujii, Tatuhisa ; et al.	2002-10-03
Inspection apparatus, inspection method and inspection unit therefor App 20020140442 - Ishioka, Shogo ; et al.	2002-10-03
Method and apparatus for inspection App 20020135390 - Fujii, Tatuhisa ; et al.	2002-09-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.