Ishimaru; Shinji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ishimaru; Shinji.The latest application filed is for "x-ray fluorescence analysis measurement method and x-ray fluorescence analysis measurement device".
- Ishimaru; Shinji - Osaka JP
- Ishimaru; Shinji - Soka JP
- Ishimaru; Shinji - Sohka JP
| Patent | Date |
|---|---|
| X-ray fluorescence analysis measurement method and X-ray fluorescence analysis measurement device Grant 11,047,814 - Ishimaru June 29, 2 | 2021-06-29 |
| X-ray Fluorescence Analysis Measurement Method And X-ray Fluorescence Analysis Measurement Device App 20210164925 - Ishimaru; Shinji | 2021-06-03 |
| Electroless nickel plating bath and method for electroless nickel plating Grant 8,292,993 - Inagawa , et al. October 23, 2 | 2012-10-23 |
| Electroless Nickel Plating Bath And Method For Electroless Nickel Plating App 20100136244 - Inagawa; Hiromu ; et al. | 2010-06-03 |
| Base isolation device for structure Grant 7,441,376 - Ishimaru , et al. October 28, 2 | 2008-10-28 |
| Vibration suppressing structure Grant 5,265,387 - Ishimaru , et al. November 30, 1 | 1993-11-30 |
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