Ishimaru; Ichiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ishimaru; Ichiro.The latest application filed is for "spectral measurement device and spectral measurement method".

Company Profile

0.23.22

Ishimaru; Ichiro - Takamatsu JP
ISHIMARU; Ichiro - Takamatsu-shi JP
Ishimaru; Ichiro - Kagawa JP
Ishimaru; Ichiro - Mure JP
Ishimaru; Ichiro - Kita-gun JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Spectral measurement device and spectral measurement method Grant 11,402,270 - Ishimaru August 2, 2	2022-08-02
Optical measuring apparatus and optical measuring method Grant 11,231,272 - Akagawa , et al. January 25, 2	2022-01-25
Spectral Measurement Device And Spectral Measurement Method App 20210310869 - ISHIMARU; Ichiro	2021-10-07
Optical characteristic measuring device and optical characteristic measuring method Grant 11,035,782 - Ishimaru June 15, 2	2021-06-15
Optical Measuring Apparatus And Optical Measuring Method App 20200333128 - AKAGAWA; Takeshi ; et al.	2020-10-22
Optical Characteristic Measuring Device And Optical Characteristic Measuring Method App 20200284717 - ISHIMARU; Ichiro	2020-09-10
Light measurement device and optical axis adjustment method Grant 10,545,016 - Akagawa , et al. Ja	2020-01-28
Living body determination device, living body determination method, and program Grant 10,503,958 - Ohno , et al. Dec	2019-12-10
Reflected light detecting device and reflected light detecting method Grant 10,386,236 - Hayashi , et al. A	2019-08-20
Light Measurement Device And Optical Axis Adjustment Method App 20190204065 - AKAGAWA; Takeshi ; et al.	2019-07-04
Living Body Determination Device, Living Body Determination Method, And Program App 20180239944 - OHNO; Yuji ; et al.	2018-08-23
Reflected Light Detecting Device And Reflected Light Detecting Method App 20170336263 - HAYASHI; Hiroki ; et al.	2017-11-23
Microparticle measurement device Grant 9,778,166 - Ishimaru October 3, 2	2017-10-03
Microparticle Measurement Device App 20170045437 - ISHIMARU; Ichiro	2017-02-16
Surface inspection apparatus and method thereof Grant 9,551,670 - Ishimaru , et al. January 24, 2	2017-01-24
Spectroscopic measurement device Grant 9,513,165 - Ishimaru December 6, 2	2016-12-06
Spectroscopic measurement device having diffraction grating at conjugate plane of relay lens Grant 9,488,524 - Ishimaru November 8, 2	2016-11-08
Spectroscopic measurement device having transmissive optical member with a sloped face Grant 9,482,576 - Ishimaru November 1, 2	2016-11-01
Spectral characteristics measurement device and spectral characteristics measurement method Grant 9,474,476 - Ishimaru October 25, 2	2016-10-25
Spectroscopic Measurement Device App 20150268097 - Ishimaru; Ichiro	2015-09-24
Spectroscopic Measurement Device App 20150260573 - Ishimaru; Ichiro	2015-09-17
Spectroscopic Measurement Device App 20150198483 - ISHIMARU; Ichiro	2015-07-16
Spectroscopic measurement device and spectroscopic measurement method Grant 8,988,689 - Ishimaru March 24, 2	2015-03-24
Spectral Characteristics Measurement Device And Spectral Characteristics Measurement Method App 20150043001 - Ishimaru; Ichiro	2015-02-12
Optical characteristic measurement device and optical characteristic measurement method Grant 8,830,462 - Ishimaru September 9, 2	2014-09-09
Surface Inspection Apparatus And Method Thereof App 20140218723 - ISHIMARU; Ichiro ; et al.	2014-08-07
Surface inspection apparatus and method thereof Grant 8,729,514 - Ishimaru , et al. May 20, 2	2014-05-20
Optical Characteristic Measurement Device And Optical Characteristic Measurement Method App 20130335740 - Ishimaru; Ichiro	2013-12-19
Spectroscopic Measurement Device And Spectroscopic Measurement Method App 20130215428 - Ishimaru; Ichiro	2013-08-22
Surface Inspection Apparatus And Method Thereof App 20120069329 - ISHIMARU; Ichiro ; et al.	2012-03-22
Surface inspection apparatus and method thereof Grant 7,952,085 - Ishimaru , et al. May 31, 2	2011-05-31
Surface Inspection Apparatus And Method Thereof App 20090103078 - ISHIMARU; Ichiro ; et al.	2009-04-23
Surface inspection apparatus and method thereof Grant 7,417,244 - Ishimaru , et al. August 26, 2	2008-08-26
Surface inspection apparatus and method thereof Grant 7,242,016 - Ishimaru , et al. July 10, 2	2007-07-10
Surface inspection apparatus and method thereof App 20070121108 - Ishimaru; Ichiro ; et al.	2007-05-31
Device and method for measuring thickness Grant 7,204,146 - Ishimaru , et al. April 17, 2	2007-04-17
Device and method for measuring thickness App 20060144147 - Ishimaru; Ichiro ; et al.	2006-07-06
Surface inspection apparatus and method thereof App 20050185172 - Ishimaru, Ichiro ; et al.	2005-08-25
Surface inspection apparatus and method thereof Grant 6,894,302 - Ishimaru , et al. May 17, 2	2005-05-17
Surface inspection apparatus and method thereof App 20010030296 - Ishimaru, Ichiro ; et al.	2001-10-18

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