Ishikawa; Tamao Patent Filings

Patent	Date
Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method Grant 8,995,748 - Sakai , et al. March 31, 2	2015-03-31
Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program Grant 8,595,666 - Hayakawa , et al. November 26, 2	2013-11-26
Defect Image Processing Apparatus, Defect Image Processing Method, Semiconductor Defect Classifying Apparatus, And Semiconductor Defect Classifying Method App 20120141011 - Sakai; Tsunehiro ; et al.	2012-06-07
Semiconductor Defect Classifying Method, Semiconductor Defect Classifying Apparatus, And Semiconductor Defect Classifying Program App 20120131529 - Hayakawa; Koichi ; et al.	2012-05-24
Evaluation object pattern determining apparatus, evaluation object pattern determining method, evaluation object pattern determining program and pattern evaluating system Grant 8,139,845 - Noguchi , et al. March 20, 2	2012-03-20
Semiconductor Defect Integrated Projection Method And Defect Inspection Support Apparatus Equipped With Semiconductor Defect Integrated Projection Function App 20110296362 - Ishikawa; Tamao ; et al.	2011-12-01
Evaluation Object Pattern Determining Apparatus, Evaluation Object Pattern Determining Method, Evaluation Object Pattern Determining Program And Pattern Evaluating System App 20090110262 - Noguchi; Takashi ; et al.	2009-04-30

Patent

Date

Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method
Grant 8,995,748 - Sakai , et al. March 31, 2

2015-03-31

Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program
Grant 8,595,666 - Hayakawa , et al. November 26, 2

2013-11-26

Defect Image Processing Apparatus, Defect Image Processing Method, Semiconductor Defect Classifying Apparatus, And Semiconductor Defect Classifying Method
App 20120141011 - Sakai; Tsunehiro ; et al.

2012-06-07

Semiconductor Defect Classifying Method, Semiconductor Defect Classifying Apparatus, And Semiconductor Defect Classifying Program
App 20120131529 - Hayakawa; Koichi ; et al.

2012-05-24

Evaluation object pattern determining apparatus, evaluation object pattern determining method, evaluation object pattern determining program and pattern evaluating system
Grant 8,139,845 - Noguchi , et al. March 20, 2

2012-03-20

Semiconductor Defect Integrated Projection Method And Defect Inspection Support Apparatus Equipped With Semiconductor Defect Integrated Projection Function
App 20110296362 - Ishikawa; Tamao ; et al.

2011-12-01

Evaluation Object Pattern Determining Apparatus, Evaluation Object Pattern Determining Method, Evaluation Object Pattern Determining Program And Pattern Evaluating System
App 20090110262 - Noguchi; Takashi ; et al.

2009-04-30

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Ishikawa; Tamao

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