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Patent applications and USPTO patent grants for Ishikawa; Syuji.The latest application filed is for "inspection system for device to be tested, and method for operating inspection system for device to be tested".
Patent | Date |
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Inspection system for device to be tested, and method for operating inspection system for device to be tested Grant 10,161,990 - Takita , et al. Dec | 2018-12-25 |
Inspection System For Device To Be Tested, And Method For Operating Inspection System For Device To Be Tested App 20170023636 - TAKITA; Nobuyuki ;   et al. | 2017-01-26 |
FRP molded article and method of producing the same Grant 6,749,934 - Nagayama , et al. June 15, 2 | 2004-06-15 |
Frp molded article and method of producing the same App 20030026984 - Nagayama, Kazuki ;   et al. | 2003-02-06 |
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