Ishiide; Hidenori
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ishiide; Hidenori.The latest application filed is for "inspection apparatus with improved detection of surface defects over large and curved surfaces".
- Ishiide; Hidenori - Higashihiroahima JP
| Patent | Date |
|---|---|
| Inspection apparatus with improved detection of surface defects over large and curved surfaces Grant 5,237,404 - Tanaka , et al. August 17, 1 | 1993-08-17 |
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