Ishii; Toshinori
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ishii; Toshinori.The latest application filed is for "silicon electrode plate for plasma etching with superior durability".
- Ishii; Toshinori - Osaka JP
- Ishii; Toshinori - Hyogo-ken JP
- Ishii; Toshinori - Sanda JP
- Ishii; Toshinori - Aichi JP
- Ishii, Toshinori - Sanda-shi JP
- Ishii, Toshinori - Nishiwaki-shi JP
- Ishii; Toshinori - Hitachi JP
- Ishii; Toshinori - Kurashiki JP
| Patent | Date |
|---|---|
| Silicon electrode plate for plasma etching with superior durability Grant 7,820,007 - Fujiwara , et al. October 26, 2 | 2010-10-26 |
| Silicon electrode plate for plasma etching with superior durability App 20070181868 - Fujiwara; Hideki ; et al. | 2007-08-09 |
| Contact probe and probe device Grant 7,015,710 - Yoshida , et al. March 21, 2 | 2006-03-21 |
| Control apparatus and method for automatic transmission Grant 7,006,907 - Usuki , et al. February 28, 2 | 2006-02-28 |
| Control apparatus and method for automatic transmission App 20050222735 - Usuki, Katsutoshi ; et al. | 2005-10-06 |
| Contact probe and probe device Grant 6,937,042 - Yoshida , et al. August 30, 2 | 2005-08-30 |
| Contact probe and probe device Grant 6,919,732 - Yoshida , et al. July 19, 2 | 2005-07-19 |
| Contact probe and probe device Grant 6,917,211 - Yoshida , et al. July 12, 2 | 2005-07-12 |
| Contact probe and probe device Grant 6,903,563 - Yoshida , et al. June 7, 2 | 2005-06-07 |
| Contact probe and probe device Grant 6,900,647 - Yoshida , et al. May 31, 2 | 2005-05-31 |
| Contact probe and probe device App 20050007130 - Yoshida, Hideaki ; et al. | 2005-01-13 |
| Contact probe and probe device App 20050001642 - Yoshida, Hideaki ; et al. | 2005-01-06 |
| Contact probe and probe device App 20050001644 - Yoshida, Hideaki ; et al. | 2005-01-06 |
| Contact probe and probe device App 20050001641 - Yoshida, Hideaki ; et al. | 2005-01-06 |
| Contact probe and probe device App 20050001643 - Yoshida, Hideaki ; et al. | 2005-01-06 |
| Contact probe and probe device App 20040160236 - Yoshida, Hideaki ; et al. | 2004-08-19 |
| Contact probe and probe device Grant 6,710,608 - Yoshida , et al. March 23, 2 | 2004-03-23 |
| Contact probe and probe device App 20020186030 - Yoshida, Hideaki ; et al. | 2002-12-12 |
| Contact Probe For Testing Liquid Crystal Display And Liquid Crystal Display Testing Device Having Thereof App 20010040451 - YOSHIDA, HIDEAKI ; et al. | 2001-11-15 |
| Contact Probe And Probe Device App 20010019276 - YOSHIDA, HIDEAKI ; et al. | 2001-09-06 |
| Method of purifying copper electrolytic solution Grant 5,783,057 - Tomita , et al. July 21, 1 | 1998-07-21 |
| Platinum-cobalt alloy sputtering target and method for manufacturing same Grant 5,282,946 - Kinoshita , et al. February 1, 1 | 1994-02-01 |
| Method and apparatus for manufacturing a fiber reinforced thermoplastic sheet-shaped molding by using suction to partially impregnate a fiber web Grant 5,225,140 - Hayashikoshi , et al. July 6, 1 | 1993-07-06 |
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