Ishiguro; Koji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ishiguro; Koji.The latest application filed is for "mass spectrometer".

Company Profile

0.22.23

Ishiguro; Koji - Hitachinaka JP
Ishiguro; Koji - Ibaraki JP
ISHIGURO; Koji - Hitachinaka-shi JP
Ishiguro; Koji - Toyoake JP
Ishiguro; Koji - Toyoake-shi JP
Ishiguro; Koji - Toyoake-city JP
Ishiguro; Koji - Hitachi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mass spectrometer Grant 9,281,169 - Morokuma , et al. March 8, 2	2016-03-08
Sample preparation container Grant D748,813 - Ishiguro , et al. February 2, 2	2016-02-02
Component analyzer Grant D746,476 - Noda , et al. December 29, 2	2015-12-29
Mass Spectrometer App 20150187554 - MOROKUMA; Hidetoshi ; et al.	2015-07-02
Mass spectrometer Grant 9,006,679 - Morokuma , et al. April 14, 2	2015-04-14
Sample holder for a component analyzer Grant D711,011 - Noda , et al. August 12, 2	2014-08-12
Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample Grant 8,779,400 - Shichi , et al. July 15, 2	2014-07-15
Mass spectrometer Grant 8,664,588 - Noda , et al. March 4, 2	2014-03-04
Ion Beam Processing Apparatus App 20130320209 - SHICHI; Hiroyasu ; et al.	2013-12-05
Mass Spectrometer App 20130320207 - MOROKUMA; Hidetoshi ; et al.	2013-12-05
Ion Source, Ion Beam Processing/observation Apparatus, Charged Particle Beam Apparatus, And Method For Observing Cross Section Of Sample App 20130284593 - SHICHI; Hiroyasu ; et al.	2013-10-31
Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample Grant 8,481,980 - Shichi , et al. July 9, 2	2013-07-09
Dual beam apparatus with tilting sample stage Grant 8,431,891 - Shichi , et al. April 30, 2	2013-04-30
Mass Spectrometer App 20130032711 - ISHIGURO; Koji ; et al.	2013-02-07
Mass Spectrometer App 20120248305 - NODA; Hiroyuki ; et al.	2012-10-04
Method and apparatus for controlling swivel angle of on-vehicle headlight Grant 7,810,970 - Ishiguro October 12, 2	2010-10-12
Apparatus for controlling swivel angles of on-vehicle headlights Grant 7,792,621 - Sugimoto , et al. September 7, 2	2010-09-07
Charge particle beam system, sample processing method, and semiconductor inspection system Grant 7,777,183 - Kaneoka , et al. August 17, 2	2010-08-17
Ion Beam Processing Apparatus App 20100176297 - Shichi; Hiroyasu ; et al.	2010-07-15
Ion beam processing apparatus Grant 7,700,931 - Shichi , et al. April 20, 2	2010-04-20
Apparatus for ion beam fabrication Grant 7,696,496 - Tomimatsu , et al. April 13, 2	2010-04-13
Manufacturing equipment using ION beam or electron beam Grant 7,592,606 - Ishiguro , et al. September 22, 2	2009-09-22
Ion Source, Ion Beam Processing/observation Apparatus, Charged Particle Beam Apparatus, And Method For Observing Cross Section Of Sample App 20090230299 - Shichi; Hiroyasu ; et al.	2009-09-17
Apparatus for ion beam fabrication App 20080283778 - Tomimatsu; Satoshi ; et al.	2008-11-20
Method and apparatus for controlling swivel angle of on-vehicle headlight App 20080239735 - Ishiguro; Koji	2008-10-02
Apparatus for controlling swivel angles of on-vehicle headlights App 20080106886 - Sugimoto; Toshio ; et al.	2008-05-08
Apparatus for controlling swivel angles of on-vehicle headlights App 20080103661 - Sugimoto; Toshio ; et al.	2008-05-01
Ion Beam Processing Apparatus App 20080073582 - Shichi; Hiroyasu ; et al.	2008-03-27
Charged Particle Beam System, Sample Processing Method, and Semiconductor Inspection System App 20080029699 - KANEOKA; Noriyuki ; et al.	2008-02-07
Manufacturing Equipment Using ION Beam or Electron Beam App 20080018460 - Ishiguro; Koji ; et al.	2008-01-24
Charged particle beam system, semiconductor inspection system, and method of machining sample App 20070158560 - Kaneoka; Noriyuki ; et al.	2007-07-12
Ion beam apparatus and analysis method App 20060284115 - Kaneoka; Noriyuki ; et al.	2006-12-21
Apparatus for automatically adjusting direction of light axis of vehicle headlight Grant 7,118,238 - Ishiguro October 10, 2	2006-10-10
Apparatus for automatically adjusting direction of light axis of vehicle headlight Grant 7,104,664 - Sugimoto , et al. September 12, 2	2006-09-12
Optical axis controller App 20060087856 - Sugimoto; Toshio ; et al.	2006-04-27
Vehicular headlight axis control device Grant 6,984,059 - Ishiguro , et al. January 10, 2	2006-01-10
Apparatus for automatically adjusting direction of light axis of vehicle headlight App 20050135081 - Ishiguro, Koji	2005-06-23
Apparatus for automatically adjusting direction of light axis of vehicle headlight App 20050068782 - Sugimoto, Toshio ; et al.	2005-03-31
Automatic optical axis direction adjusting device for vehicle headlight App 20040210369 - Mizuno, Ryu ; et al.	2004-10-21
Vehicular headlight axis control device App 20040160759 - Ishiguro, Koji ; et al.	2004-08-19
Gas supply apparatus and film forming apparatus Grant 6,224,676 - Nakajima , et al. May 1, 2	2001-05-01

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.