loadpatents
Patent applications and USPTO patent grants for ISHIBASHI; Masayoshi.The latest application filed is for "viscoelasticity calculation system and viscoelasticity measurement method".
Patent | Date |
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Viscoelasticity Calculation System And Viscoelasticity Measurement Method App 20220160292 - ZHANG; Yuhua ;   et al. | 2022-05-26 |
Viscoelasticity calculation system and viscoelasticity measurement method Grant 11,219,407 - Zhang , et al. January 11, 2 | 2022-01-11 |
Worker Assignment System And Worker Assignment Device App 20210097459 - ISHIBASHI; Masayoshi ;   et al. | 2021-04-01 |
Work Information Management System And Work Information Management Method App 20210056646 - YOSHIMOTO; Hiroyuki ;   et al. | 2021-02-25 |
Biological Information Detecting Apparatus And Biological Information Detecting Method App 20200155008 - FUKUDA; Nobuhiro ;   et al. | 2020-05-21 |
Resource Planning Apparatus And Resource Plan Visualization Method App 20200134526 - HAGA; Noriyuki ;   et al. | 2020-04-30 |
Viscoelasticity Calculation System And Viscoelasticity Measurement Method App 20180177448 - ZHANG; Yuhua ;   et al. | 2018-06-28 |
Monitoring system Grant 9,728,060 - Ishii , et al. August 8, 2 | 2017-08-08 |
Monitoring System App 20150356849 - ISHII; Tomoyuki ;   et al. | 2015-12-10 |
Wearable Power Assist System App 20150190249 - Ishibashi; Masayoshi ;   et al. | 2015-07-09 |
Magnetic recording head having a non-conformal side gap and methods of production thereof Grant 8,767,344 - Ishibashi , et al. July 1, 2 | 2014-07-01 |
Magnetic Recording Head Having A Non-conformal Side Gap And Methods Of Production Thereof App 20120162811 - Ishibashi; Masayoshi ;   et al. | 2012-06-28 |
Wiring board and method for manufacturing the same Grant 8,120,070 - Nakazato , et al. February 21, 2 | 2012-02-21 |
Perpendicular Recording Magnetic Head, Manufacturing Method Thereof And Magnetic Disk Drive App 20110222188 - Etoh; Kimitoshi ;   et al. | 2011-09-15 |
Display device Grant 7,973,744 - Ishibashi , et al. July 5, 2 | 2011-07-05 |
Method of coating substrate Grant 7,799,701 - Heike , et al. September 21, 2 | 2010-09-21 |
Actuator and material for the actuator Grant 7,692,361 - Kato , et al. April 6, 2 | 2010-04-06 |
Semiconductor Device and manufacturing Method of Semiconductor Device App 20090159950 - Ishibashi; Masayoshi ;   et al. | 2009-06-25 |
Wiring Board and Method for manufacturing the Same App 20090114958 - Nakazato; Norio ;   et al. | 2009-05-07 |
Imaging apparatus and operation method of the same App 20090015545 - Kato; Midori ;   et al. | 2009-01-15 |
Method of coating substrate App 20080299292 - Heike; Seiji ;   et al. | 2008-12-04 |
Actuator and method of manufacturing actuator module Grant 7,449,818 - Kato , et al. November 11, 2 | 2008-11-11 |
Actuator and method of manufacturing actuator module Grant 7,449,817 - Kato , et al. November 11, 2 | 2008-11-11 |
Display device App 20080144160 - ISHIBASHI; Masayoshi ;   et al. | 2008-06-19 |
Actuator modules Grant 7,327,067 - Ishibashi , et al. February 5, 2 | 2008-02-05 |
Actuator and method of manufacturing actuator module App 20070241641 - Kato; Midori ;   et al. | 2007-10-18 |
Actuator and material for the actuator App 20060261709 - Kato; Midori ;   et al. | 2006-11-23 |
Actuator modules App 20060238065 - Ishibashi; Masayoshi ;   et al. | 2006-10-26 |
Probe for scanning probe lithography and making method thereof Grant 7,115,863 - Ishibashi , et al. October 3, 2 | 2006-10-03 |
Actuator film material, actuator film and actuator using the same Grant 7,064,473 - Ishibashi , et al. June 20, 2 | 2006-06-20 |
Solution mixing device and analysis system App 20060115381 - Kuno; Norihito ;   et al. | 2006-06-01 |
Actuator film material, actuator film and actuator using the same App 20050122007 - Ishibashi, Masayoshi ;   et al. | 2005-06-09 |
Electron exposure device and method and electronic characteristics evaluation device using scanning probe Grant 6,670,622 - Heike , et al. December 30, 2 | 2003-12-30 |
Electron exposure device and method and electronic characteristics evaluation device using scanning probe App 20030107007 - Heike, Seiji ;   et al. | 2003-06-12 |
Electron exposure apparatus App 20020101573 - Ishibashi, Masayoshi ;   et al. | 2002-08-01 |
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