Ishiba; Masato

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ishiba; Masato.The latest application filed is for "measuring method and apparatus using color images".

Company Profile

0.5.7

Ishiba; Masato - Kyoto JP
Ishiba; Masato - Kyoto-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods of and apparatus for inspecting substrate Grant 7,869,644 - Murakami , et al. January 11, 2	2011-01-11
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data Grant 7,680,320 - Murakami , et al. March 16, 2	2010-03-16
Apparatus for surface inspection and method and apparatus for inspecting substrate Grant 7,505,149 - Ishiba , et al. March 17, 2	2009-03-17
Method of generating image and illumination device for inspecting substrate Grant 7,394,084 - Kuriyama , et al. July 1, 2	2008-07-01
Inspection method and system for and method of producing component mounting substrate Grant 7,310,406 - Kuriyama , et al. December 18, 2	2007-12-18
Measuring method and apparatus using color images App 20070165254 - Kuriyama; Jun ; et al.	2007-07-19
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data App 20060140471 - Murakami; Kiyoshi ; et al.	2006-06-29
Methods of and apparatus for inspecting substrate App 20060018531 - Murakami; Kiyoshi ; et al.	2006-01-26
Method of generating image and illumination device for inspecting substrate App 20060000989 - Kuriyama; Jun ; et al.	2006-01-05
Inspection method and system for and method of producing component mounting substrate App 20060002510 - Kuriyama; Jun ; et al.	2006-01-05
Inspection method and system and production method of mounted substrate App 20050209822 - Ishiba, Masato ; et al.	2005-09-22
Apparatus for surface inspection and method and apparatus for inspecting substrate App 20050190361 - Ishiba, Masato ; et al.	2005-09-01

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