Ish-Shalom; Yaron
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ish-Shalom; Yaron.The latest application filed is for "systems for providing illumination in optical metrology".
- Ish-Shalom; Yaron - Kyryat Tivon IL
- Ish-Shalom; Yaron - Kiryat Tivon IL
| Patent | Date |
|---|---|
| Wafer notch detection Grant 10,366,483 - Efraty , et al. July 30, 2 | 2019-07-30 |
| Systems for providing illumination in optical metrology Grant 10,203,247 - Brady , et al. Feb | 2019-02-12 |
| Systems for Providing Illumination in Optical Metrology App 20170146399 - Brady; Gregory R. ; et al. | 2017-05-25 |
| Systems for providing illumination in optical metrology Grant 9,512,985 - Brady , et al. December 6, 2 | 2016-12-06 |
| Wafer Notch Detection App 20160086325 - EFRATY; Boris ; et al. | 2016-03-24 |
| Systems for Providing Illumination in Optical Metrology App 20140240951 - Brady; Gregory R. ; et al. | 2014-08-28 |
| Method and apparatus for measuring stress in semiconductor wafers Grant 6,678,055 - Du-Nour , et al. January 13, 2 | 2004-01-13 |
| Method and apparatus for measuring stress in semiconductor wafers App 20030098704 - Du-Nour, Ofer ; et al. | 2003-05-29 |
| Active pyrometry with emissivity extrapolation and compensation Grant 6,299,346 - Ish-Shalom , et al. October 9, 2 | 2001-10-09 |
| Temperature measuring method and apparatus Grant 6,082,892 - Adel , et al. July 4, 2 | 2000-07-04 |
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